这是您想要的页面. 查看搜索结果:

适用于 PCBA 的 i3070 系列 6 在线测试系统

Keysight i3070 系列 6 在线测试（ICT）系统以久经验证的技术为基础设计，可提供经过时间考验的软件、硬件和编程功能，大大提高测试效率。 i3070 系列 6 ICT 测试仪支持多种印刷电路板组件（PCBA）尺寸，适用于 IoT（物联网）、5G 以及汽车和能源等应用。 i3070 采用了独特的设计，使测量电路与被测器件之间的信号路径尽量缩短，从而最大限度减少寄生电容的不良影响，提高抗串扰能力，消除杂散信号耦合效应，轻松提供一致且可重复的测量结果。 系列 6 完全向后兼容以前的系统，能够执行高度可重复的测量。

i3070 系列 6 ICT 能为客户提供：

  • 更高的测试效率――硅钉测试/边界扫描速度加快 40% 以上，在测试大部分 PCBA 时，总体速度加快 6% 以上
  • 100% 向后兼容性，保证尽量缩短安装所需要的停机时间，并实现完整的代码兼容性
  • IPC 联网工厂交换（IPC-CFX）和 IPC-HERMES-9852 标准等机器对机器（M2M）功能已获认证，可以提高您的操作效率，加深对测试数据的洞察，缩短响应时间并降低操作成本
  • 现代化的软件许可方案让您可以清晰了解许可证成本，集中管理许可证，还可根据生产需求进行扩展

新型 i3070 系列 6 在线测试平台提供了可转移的测试功能，并增添了先进的工业 4.0 技术，从而可以为我们的主要印刷电路板组件制造客户带了更高良率、更快的吞吐量和更出色的操作效率。

如需了解具有数字功能的低成本在线测试系统，请参见是德科技最新的 i1000D 系统。

查看手册

保护您的创新投资

参加我们的培训计划，培养您的转型技能

请浏览课程并查看专门针对您的业务需求特别定制的课程表。

H7230A-510 i3070 Boundary Scan Concepts and Applications

Learn the advanced topics for developing Boundary-Scan Test applications on the i3070 in-circuit board tester. This class covers various concepts in boundary-scan testing, such as serial programming and testing non-boundary-scan devices using boundary-scan. In addition to testing development, various debugging techniques are also detailed. The class concludes with a "best practices" section.

H7230A-516 i3070 Advanced Digital

Learn the advanced topics for developing Digital Test applications on the i3070 in-circuit board tester. This class builds upon the fundamentals of digital vector control language (VCL) and pattern capture format (PCF) that were presented in the Fundamentals classes. The attendee will learn about erase, program, and verification techniques for parallel memory, serial memory, and devices.

H7230A #500 i3070 Family Multiplexed User Fundamentals Class I

Learn the basics needed to develop a Board Test program with the i3070 Multiplexed Board Test system. Design, develop, turn-on and debug tests. Typically, Class I and II are taken consecutively.

H7230A #555 i3070 Family Multiplexed User Fundamentals Class II

Enhanced training to take the programmer beyond the basics into custom test generation. Get more performance and coverage from your i3070. Typically, Class I and II are taken consecutively.

H7230A #514 i3070 UnMuxed User Fundamentals I

In this course, test developers will learn the standard tools that are readily available on the i3070.

H7230A #515 i3070 UnMuxed User Fundamentals II

In this course, test developers learn to customize tests, generate custom test models and receive an introduction to many of the optional test tools available on the i3070.

H7230A #520 i3070 Family Production Support Training

Learn to support the 3070 on the production line - turn-on and debug tests developed by other programmers, run testhead diagnostics and interpret the results, isolate faults (testhead, fixture, test program, printed circuit board...)

H7230A #550 3070 Family Maintenance Fundamentals

Gain an understanding of the Keysight 3070 service documentation, Confirmation, and Diagnostics, System-level card operation, power, analog, digital, and control subsystem operation, and troubleshooting.

H7230A #530 i3070 In-Line Production Support Training

New production line Technicians and Engineers supporting i3070 In-Line testers on the factory floor. The participant is trained on operational requirements and best practices to set up, run, and maintain automated i3070 In-Line testers. The participant is also instructed on the basics of i3070 hardware, software to maintain production and support implementation of product ECO.

关于 i3070 在线测试系统的特色资源

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2023.01.06

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.06

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Case Studies 2022.07.22

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.22

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Case Studies 2022.11.10

10% Increase in ADAS PCBA Testing Throughput

10% Increase in ADAS PCBA Testing Throughput

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and PathWave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.11.10

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Application Notes 2023.05.05

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.05

查看所有资源

查看所有资源

需要帮助或遇到问题？

联系我们