i3070 Series 6 In-Circuit Test System for PCBAs

Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

i3070 Series 6 ICT offers customers:

  • Improved test efficiency with >40% faster Silicon Nails / Boundary-Scan testing and >6% faster overall testing on most PCBAs
  • 100% backwards compatibility guarantees minimal down time for installation and complete code compatibility
  • Certified machine-to-machine (M2M) capabilities such as IPC Connected Factory Exchange (IPC-CFX) and IPC-HERMES-9852 standards offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand

The new i3070 Series 6 in-circuit test platform provides transportable test capabilities and adds advanced Industry 4.0 technology to deliver high yield, fast throughput and best-in-class operational efficiency for our top-tier printed circuit assembly manufacturing customers.

For a low-cost in-circuit test system with digital capability, please see Keysight latest i1000D systems.

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i3070 In-circuit Test Systems Featured Resources

 

Case Studies 2022.05.30

10% Increase in ADAS PCBA Testing Throughput With the i3070 4-Module Inline ICT and Pathwave Manufacturing Analytics

10% Increase in ADAS PCBA Testing Throughput With the i3070 4-Module Inline ICT and Pathwave Manufacturing Analytics

Automotive electronics manufacturers must be prepared to address new test challenges efficiently and effectively as advanced driver assistance systems (ADAS) technology advances. This case study shows how an automotive electronics manufacturer used the Keysight in-line 4 module ICT and Pathwave Manufacturing Analytics Software to cut down on labor-intensive tasks and increase test throughput.

2022.05.30

Application Notes 2022.04.25

Fixture Reusability Consideration From In-line to Offline

Fixture Reusability Consideration From In-line to Offline

This application note describes the differences between the i3070 Series 5 inline 4 module test system (E9986E) fixture and the offline 4 module test system fixture, as well as the fixture reusability considerations.

2022.04.25

Application Notes 2022.02.14

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.02.14

Application Notes 2021.08.04

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

Bypass Link Conveyor Built-in i7090 and i3070 In-Circuit Inline Tester

The built-in bypass link conveyor in In-Circuit tester saves you the floor space and easy to setup at the manufacturing floor.

2021.08.04

Case Studies 2020.01.06

PCBA Manufacturer Shifts Gears for Autonomous Driving with Keysight ICT

PCBA Manufacturer Shifts Gears for Autonomous Driving with Keysight ICT

Leading printed circuit board assembly manufacturer tests 15 million automotive boards with almost no downtime, exceeding its test target.

2020.01.06

Case Studies 2019.10.31

Increase Throughput with i3070 Advanced Throughput Multiplier

Increase Throughput with i3070 Advanced Throughput Multiplier

Learn how Keysight i3070 Advanced Throughput Multiplier helped an EMS company shorten test cycle time by 44% and increased production throughput by 1.8x.

2019.10.31

Application Notes 2019.10.20

i3070 In-Circuit Tester (ICT) – Industry 4.0 Ready

i3070 In-Circuit Tester (ICT) – Industry 4.0 Ready

Keysight’s plug and play i3070 In-Circuit test system supports Industry 4.0 machine to machine communication protocol of IPC-CFX standards and more.

2019.10.20

Application Notes 2019.07.02

TestJet and VTEP Hardware Description and Verification

TestJet and VTEP Hardware Description and Verification

This paper describes the TestJet and VTEP hardware components, the required connections for assembly, instructions for the setup and use of the Fixture Verifier.

2019.07.02

Application Notes 2019.02.10

Testing An Electrolytic Capacitor Using i3070 ICT System

Testing An Electrolytic Capacitor Using i3070 ICT System

A description of the alternate polarity test solution for electrolytic capacitor that mounted on printer circuit board assembly using the i3070 ICT system.

2019.02.10

Application Notes 2019.01.02

Polarized Capacitor Orientation Test in ICT Test Platform

Polarized Capacitor Orientation Test in ICT Test Platform

Learn why it is important to detect a wrongly oriented polarized capacitor and get it fixed as early as possible. Read more.

2019.01.02

Application Notes 2018.05.14

Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform

Integrate Collaborative Robot (Cobot) with i3070 ICT Test Platform

Improve production line quality, efficiency, and reduce human dependency by integrating the collaborative robot (Cobot) with the i3070 ICT test platform.

2018.05.14

Application Notes 2017.12.04

How to Build a Fixture for In-circuit Test (ICT)

How to Build a Fixture for In-circuit Test (ICT)

Explore requirements for building a robust fixture for Keysight’s Cover-Extend Technology, the latest limited access solution for in-circuit test (ICT).

2017.12.04

Case Studies 2017.11.30

VTEP Goes Head-to-Head with Keysight TestJet

VTEP Goes Head-to-Head with Keysight TestJet

Find how vectorless test EP (VTEP) improves ICT coverage up to 80 percent with TestJet. See test results conducted in Keysight’s R&D lab.

2017.11.30

Case Studies 2017.07.09

i3070 Inline ICT Improves Functional Test Yield

i3070 Inline ICT Improves Functional Test Yield

Find out how one customer improved function test yields after installing the i3070 Series 5 Inline ICT system.

2017.07.09

Application Notes 2017.06.15

Increasing Throughput on the In-Circuit Test (ICT) System

Increasing Throughput on the In-Circuit Test (ICT) System

Explore tips and tricks to reduce test time and increase throughput on the Keysight Medalist i3070 In-Circuit Test (ICT) system.

2017.06.15

Application Notes 2015.08.20

Barcode Scanning Strategy Considerations with ICT Testers

Barcode Scanning Strategy Considerations with ICT Testers

With various barcode scanning strategy considerations, discover different options for positioning barcode readers on i3070 inline ICT tester.

2015.08.20

Application Notes 2015.01.04

Tailgate Sensor Detection on i3070 Inline ICT Testers

Tailgate Sensor Detection on i3070 Inline ICT Testers

This article explains how tailgate sensors work and tailgate sensor improvements help to further minimize damages due to operator and upstream errors on ICT testers.

2015.01.04

Application Notes 2014.08.02

Protecting the Integrated Circuit from Over Powering

Protecting the Integrated Circuit from Over Powering

Learn how the power monitoring circuit on the Medalist i3070 in-circuit tester provides real-time monitoring to prevent damage to the ICs on circuit boards.

2014.08.02

Case Studies 2014.07.31

In-Circuit Tester – N5747A High-Power Power Supply

In-Circuit Tester – N5747A High-Power Power Supply

This paper discusses how the implementation of N5747A high-power power supply on a networking board project helps in cost saving of a power supply module.

2014.07.31

Case Studies 2014.07.31

In-Circuit Test Channel Partner Interview

In-Circuit Test Channel Partner Interview

Bob Bower, an industry expert in ICT programming discusses how their company was able to offer better solutions by having a channel partnership with Keysight.

2014.07.31

Case Studies 2014.07.30

In-Circuit Test Chanel Partner Interview Series

In-Circuit Test Chanel Partner Interview Series

Navigating ICT challenges requires a synergy with fixture and programming houses. Everett Charles new boundary scan improve measurably with Keysight ICT solutions.

2014.07.30

Case Studies 2014.07.30

Throughput Comparison Between Medalist i3070 Series 5 and Predecessor i3070 In-Circuit Test Systems

Throughput Comparison Between Medalist i3070 Series 5 and Predecessor i3070 In-Circuit Test Systems

The new Medalist i3070 Series 5 in-circuit tester has several new features that enable manufacturers to speed up their tests when compared with using the older i3070 series.

2014.07.30

Case Studies 2014.07.30

Utilizing Limited Access Tools on ICT System

Utilizing Limited Access Tools on ICT System

Explore the seven most effective limited access tools on the Medalist i3070 ICT system to help tackle complex and shrinking printed circuit board assemblies.

2014.07.30

Case Studies 2014.07.30

Cover-Extend Technology for In-Circuit Test

Cover-Extend Technology for In-Circuit Test

Explains how Cover-Extend Technology helps to enable test access for situations where test access becomes limited with usage of high complexity components.

2014.07.30

View All Resources

View All Resources

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