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4-Module ICT System, i307x Series 6

The E9903G 4-Module In-Circuit Test (ICT) System supports up to 5184 nodes, Series 6 executes digital testing up to 4x faster while the overall physical footprint is 38% smaller.

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  • Fixture actuation

    Vacuum

  • Maximum node count

    5184

  • System width

    1490 mm

  • Maximum parallel testing

    4

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Top configurations

See what's included, and how you can upgrade your experience with Keysight.

E9903G 4-Module ICT System, i307x Series 6
E9903G 4-Module ICT System, i307x Series 6

Model:

E9903G

QTY

Options

1

E9903G; 4-Module In-Circuit Test System; i307x, Series 6 | Default Panel | Standard Support Arm | 3-Phase, WYE with Neutral, Supports 220/380-240/415VAC (Line to Neutral/Line to Line) | PWR OPTN, Greater than 220VAC | HDW ACCY, System Shroud, Large ICT, Standard, NEW | Printer | Installation Service | i3070 Mux System Testhead, GTE 11.00p | i3070 UnMux Test Development, GTE 11.00p | License To Use 12MPs, GTE 11.00p | i3070 Base Software | Base Software node-locked perpetual license. | Base software updates and enhancements, node-locked - 2 years.

1

4-Module ICT system Config; 4 Mods Activated (XTPB); 36 DD12 Cards; 4 6751A P/S and Software Bundle

1

HP Engage Flex Pro G2 PC Controller; offline; SW version 11.XXp

1

USB Interface Kit (complete) for Series 6 Offline

1

ASRU Card CoC Descriptor

1

Software kit

1

2 years 8x5 Cooperative Support, with Parts Next business day and 8x5 HW Phone Support for ICT systems

1

2 years 8x5 Software Phone Support Services.

1

2 years On-site system calibration agreement, commercial grade, 2x per year.

1

Standard Opt Out

1

i3070 Standard SW Bundle, GTE 11.00p

1

Boundary Scan 1149.6 Feature, GTE 11.00p

1

i3070 Basic SW Bundle, GTE 11.00p

1

Software Update for Test Development Feature

1

Drive Thru Feature, GTE 11.00p

1

Silicon Nails Feature Runtime only, GTE 11.00p

1

Cover Extend Feature, GTE 11.00p

1

i3070 NIST Calibration and DGN Advanced Reporting SW Bundle Feature, GTE 11.00p

1

i3070 Mux Test Development, GTE 11.00p

Highlights

  • Maximum node count: 5,184
  • Maximum channel count: 1,152
  • Footprint: 1.49 m x 0.94 m or 4.89’ x 3.08’
  • Maximum number of modules: 4

Stay Connected. Evolve Continuously

Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.

i3070 Series 6 ICT offers customers:

  • Improved test efficiency with >40% faster Silicon Nails / Boundary-Scan testing and >6% faster overall testing on most PCBAs
  • 100% backward compatibility guarantees minimal downtime for installation and complete code compatibility
  • Certified machine-to-machine (M2M) capabilities such as IPC Connected Factory Exchange (IPC-CFX) and IPC-HERMES-9852 standards offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.
  • The new i3070 Series 6 in-circuit test platform provides transportable test capabilities and adds advanced Industry 4.0 technology to deliver high yield, fast throughput, and operational efficiency for our top-tier printed circuit assembly manufacturing customers.

Services and support