Highlights

  • Maximum node count: 5,184
  • Maximum channel count: 1,152
  • Footprint: 1.49 m x 0.94 m or 4.89’ x 3.08’
  • Maximum number of modules: 4

Your production line demands high throughput — test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming
  • 100% backward compatibility guarantees minimal downtime for installation and complete code compatibility
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses
  • Industry-leading support with Keysight On-site Now! glasses. Get quick, secure, hands-free help from the experts in record time
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand

Principais especificações

Fixture Actuation
Vacuum
Max Node Count
5184
Max Parallel Testing
4
System Type
Offline System
System Width
1490 mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Vacuum
5184
4
Offline System
1490 mm
Visualizar mais
Fixture Actuation:
Vacuum
Max Node Count:
5184
Max Parallel Testing:
4
System Type:
Offline System
System Width:
1490 mm
E9903G 4-Module In-Circuit Test (ICT) System

Interested in a E9903G?

Featured Resources

Application Notes 2024.01.30

Streamlining In-System Programming

Streamlining In-System Programming

This application note explores the challenges and solutions in implementing In-System Programming (ISP) on densely populated circuit boards. Focusing on Keysight's advanced ICT system, the document discusses upgraded hardware configurations and introduces the ISP OpenTAP plug-in for streamlined test sequence generation. With a simplified approach to test generation and execution, Keysight's solution offers an efficient pathway for ISP integration. This resource serves as a practical guide for test engineers seeking to optimize ISP processes, enhance efficiency, and reduce complexities in programming.

2024.01.30

Application Notes 2024.01.30

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.01.30

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

Application Notes 2024.01.24

Advancing Cluster Testing for High-Density PCBA in Automotive Electronics

Advancing Cluster Testing for High-Density PCBA in Automotive Electronics

This application note delves into the dynamic evolution of Printed Circuit Boards (PCBs) and the challenges posed by the advent of multilayered PCBs, particularly in the context of limited test points. It explores the significance of testing these intricate structures and introduces the concept of cluster testing as a solution.

2024.01.24

Application Notes 2024.01.23

Enhanced Short Tests for High Impedance Nodes

Enhanced Short Tests for High Impedance Nodes

This application note introduces an Enhanced Short Test algorithm tailored to tackle the testing challenges associated with high-impedance nodes in Printed Circuit Board Assemblies (PCBAs). Integrated into the Keysight In-Line High-Density In-Circuit Test (ICT) system, the Enhanced Short Test significantly boosts the efficiency of short detection for high-impedance nodes, leading to a noteworthy 57% reduction in testing time. High-impedance nodes, commonly found in modern PCBAs to enhance signal quality and reduce power consumption, present difficulties such as extended stabilization times, heightened sensitivity, diminished current flow, intricate isolation procedures, and concerns regarding signal stability.

2024.01.23

Veja todos os recursos

Veja todos os recursos

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