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Highlights

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  • Maximum node count: 5,184
  • Maximum channel count: 1,152
  • Footprint: 1.49 m x 0.94 m or 4.89’ x 3.08’
  • Maximum number of modules: 4

Your production line demands high throughput — test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.

  • Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming
  • 100% backward compatibility guarantees minimal downtime for installation and complete code compatibility
  • Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses
  • Industry-leading support with Keysight On-site Now! glasses. Get quick, secure, hands-free help from the experts in record time
  • Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand

Key Specifications

Download Data Sheet
Fixture Actuation
Vacuum
Max Node Count
5184
Max Parallel Testing
4
System Type
Offline System
System Width
1490 mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Vacuum
5184
4
Offline System
1490 mm
View More
Fixture Actuation:
Vacuum
Max Node Count:
5184
Max Parallel Testing:
4
System Type:
Offline System
System Width:
1490 mm
E9903G 4-Module In-Circuit Test (ICT) System

Interested in a E9903G?

Extend the Capabilities for your 4-Module In-Circuit Test (ICT) System, I307x Series 6

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Featured Resources

Application Notes 2023.05.04

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

Plug and Play i3070 In-Circuit Tester into your Industry 4.0 Smart Factory using IPC-CFX

The backbone of Industry 4.0 applications is machine to machine communication. Transportation of information between machines and systems or machines to machines enables decentralized decision making. The challenge with machine-to-machine communication is that there was no standard “language”, each machine had its own communication protocols. IPC-CFX is an electronics manufacturing industry developed standard to address this challenge. IPC-CFX simplifies and standardizes machine to machine communication while also facilitating machine to business/business to machine solutions. Keysight’s i3070 In-Circuit test system supports IPC-CFX, as well as other communication protocols such as MQTT, OPC-UA and Panasonic’s iLNB.

2023.05.04

Application Notes 2023.03.20

Configuring the i3070 Settings with Autocode

Configuring the i3070 Settings with Autocode

The i3070 is a widely used Automatic Test Equipment (ATE) model for testing printed circuit boards (PCBs) in the electronics industry. The i3070 uses a Programmable Logic Controller (PLC) address and data, which is referred to as "autocode" to configure various settings and configurations, including the "dual board staging" setting. However, changing these settings during production changeover can be risky, as it requires access to maintenance mode and can result in errors if wrongly selected. This application note provides guidance on setting up auto-code in the “testplan” to improve the efficiency and accuracy of the i3070 configuration process.

2023.03.20

Application Notes 2023.01.05

Practical Bead Probe Implementation Strategy

Practical Bead Probe Implementation Strategy

This application note demonstrated how you could improve the test coverage on small and complex PCBAs by adopting the bead probe handbook's strategy. This paper showcased the different experiments on the stencil aperture and fixture probe style to validate the optimum parameters.

2023.01.05

Application Notes 2023.01.04

Essential Steps for Practical Bead Probe Implementation

Essential Steps for Practical Bead Probe Implementation

This document summarizes the bead probe handbook and other relevant white papers that describe effective methods for bead probe implementation. This paper shows how to use the formula to fine-tune the parameters to achieve optimal bead heights and emphasizes the importance of considering the impact of various variables such as bead height, length, and aperture size, as well as probe force, and selecting the appropriate probe head style for different types of applications.

2023.01.04

Application Notes 2022.09.23

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

Developing a Fixture for Extra-Large Printed Circuit Boards (PCBA)

The i3070 4-module Inline In-Circuit Tester is capable of meeting the stated board size requirements with the i3070 10.20p software version. This application note describes how to change some of the key parameters within the software to create the fixturing and test programs to accommodate a larger PCBA board requirement.

2022.09.23

Application Notes 2022.07.05

Test Program Migration to 10.x software

Test Program Migration to 10.x software

How to use system variable to minimize the effort on migrating the existing test program to run on i3070 software version 10.x or latest

2022.07.05

View All Resources

View All Resources

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