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HIGHLIGHTS

  • 软件：TestExec SL 6.1 和 TS-5400 系统软件 6.0
  • 信号切换：高达 112 x 4 矩阵
  • 负载切换：高达 32 通道 x 7.5 A 和 40 通道 x 5 A以及 192 通道 x 2 A
  • 射频开关：多达 2 个 Quad 1 x 4 射频开关卡（DC-3GHz）
  • 电源：高达 400W 的模块化电源
  • 测量：6.5 位数字万用表、2 通道 225 MHz 计数器
  • 激励：单通道 14 位 20 MHz ARB、4 通道 16 位 DAC

Keysight TS-5040 功能测试系统是一个经济高效、精确可靠的测试系统，可提供最低的拥有成本。此外，开放式 Test Exec SL 体系结构具有最大的灵活性，使您能够随心所欲地执行任何操作。

从是德功能测试论坛获取最新技巧和信息。

了解如何使用 Keysight TestExec SL 软件加快软件开发和测试集成

阅读 TS-5020 和 TS-5040 配置指南，了解如何配置系统。

主要技术指标

下载技术资料
应用
ABS sensor
Climate control
Small body electronic Module
描述
The TS-5040 automotive functional test system is a low cost, scalable solution for automotive electronic manufacturers, that is ideal for testing both low-frequency (AC and DC). Its 0.75m rack height is ideal for space efficiency.
仪器
GPIB
连接数
up to 100
up to 50
串行通信
CAN Single or Dual
ISO 9141
J1850
J1939
负载电流
1.5
应用
描述
仪器
连接数
串行通信
负载电流
ABS sensor
Climate control
Small body electronic Module
The TS-5040 automotive functional test system is a low cost, scalable solution for automotive electronic manufacturers, that is ideal for testing both low-frequency (AC and DC). Its 0.75m rack height is ideal for space efficiency.
GPIB
up to 100
up to 50
CAN Single or Dual
ISO 9141
J1850
J1939
1.5
查看更多
应用:
ABS sensor
Climate control
Small body electronic Module
描述:
The TS-5040 automotive functional test system is a low cost, scalable solution for automotive electronic manufacturers, that is ideal for testing both low-frequency (AC and DC). Its 0.75m rack height is ideal for space efficiency.
仪器:
GPIB
连接数:
up to 100
up to 50
串行通信:
CAN Single or Dual
ISO 9141
J1850
J1939
负载电流:
1.5
开关电压(+/-):
200V V
TS-5040 functional test system

Interested in a TS-5040?

Extend the Capabilities of Your Functional Test System

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Featured Resources for TS-5040 Functional Test System

Application Notes 2017.12.01

Database Connectivity Guide for TestExec SL

Database Connectivity Guide for TestExec SL

This paper outlines the importance of proper data logging in a database and discusses best practices to import XML files from TestExec into a database.

2017.12.01

Application Notes 2014.07.31

Configuring Signal and Load Switching Using TestExec SL

Configuring Signal and Load Switching Using TestExec SL

Find out how easy it is to use TestExec SL software to set up and configure signal switching and load switching to shorten test development time.

2014.07.31

Application Notes 2014.07.31

Creating Hardware Handler in C/C++ for Keysight TestExec SL

Creating Hardware Handler in C/C++ for Keysight TestExec SL

Learn how to create a hardware handler in C/C++ to enhance TestExec SL’s ability to control devices by communicating directly with the instrument’s driver.

2014.07.31

应用指南 2014.08.04

Testplan Development on CVI Labwindows with TS-5400 PXI Series

Testplan Development on CVI Labwindows with TS-5400 PXI Series

This application note provides set-up guidelines to start developing your testplan on CVI Labwindows using the Keysight U8972A TS-5400 PXI Series functional test system.

2014.08.04

Technical Overviews 2017.12.01

Flashing Solutions-Dedicated Platform for Flash Programming

Flashing Solutions-Dedicated Platform for Flash Programming

Keysight’s flashing solutions for on-board EEPROM flash programming of industrial and automotive devices offer users flexibility and cost savings.

2017.12.01

Technical Overviews 2014.07.31

Pre-Configured Functional Test System Platform

Pre-Configured Functional Test System Platform

The pre-configured Keysight Functional Test Platform provides users with a robust and ready-to-use solution for multiple applications in various industries, such as industrial and automotive segments.

2014.07.31

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