Choose a country or area to see content specific to your location
白皮书
Micro-processors, controller ICs, memory chips and ICs that have speed and voltage levels that are beyond the regular ranges that conventional In-Circuit Testers can support. These devices pose various challenges to test engineers when it comes to test coverage. In today’s fast paced manufacturing test environment, test engineers simply cannot afford the time and effort to develop functional test libraries for digital devices. Even if time is not a factor, the complexity of today’s integrated circuits makes test libraries development almost impossible.
解锁内容
免费注册
*Indicates required field
感谢您!
您的表格已成功提交
当您的浏览器 cookie 已过期或浏览器缓存已被清除,您的访问权限将自动被重置。请重新访问内容,并请重新登录即可。
×
请销售人员联系我。
*Indicates required field
感谢您!
A sales representative will contact you soon.