Choose a country or area to see content specific to your location
应用文章
The atomic force microscope (AFM) has become a powerful tool for investigating surfaces on an atomic or nanometer scale. An AFM consists of a sharp cantilevered tip that is raster-scanned with sub-nanometer precision over a surface. The interaction forces between the tip and sample cause a minute cantilever deflection, which is sensed by optical deflection to produce a topographical map of the surface on the nanometer or atomic scale.
解锁内容
免费注册
*Indicates required field
感谢您!
您的表格已成功提交
当您的浏览器 cookie 已过期或浏览器缓存已被清除,您的访问权限将自动被重置。请重新访问内容,并请重新登录即可。
×
请销售人员联系我。
*Indicates required field
感谢您!
A sales representative will contact you soon.