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Improving the Test Efficiency of MEMS Capacitive Sensors

Improving the Test Efficiency of MEMS Capacitive Sensors

应用文章

  • Exceptional accuracy and repeatability
  • DC bias function up to 40 V (Option 001)
  • High-speed measurement, scanner interface (Option 301)

This application brief describes the features of the Keysight Technologies, Inc. E4980A and how it can mdramatically improve the test efficiency of MEMS capacitive sensors.

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