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要想对半导体器件进行精确的 DC/CV（和射频）统计建模，需要收集在多个温度下测量不同晶圆所获得的大量数据。是德科技推荐您使用 IC-CAP WaferPro，它作为一键式 DC/CV 和射频自动化表征解决方案，可以帮助建模和器件工程师更高效地进行各种温度下的晶圆上测量。这款创新的解决方案以 IC-CAP 建模软件为基础，可以高效地控制 DC/CV 分析仪、网络分析仪、探头、开关矩阵、温度卡盘以及是德科技功能强大的 407x 和 408x 系列参数测试仪。

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