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segmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912csegmentation:business-unit/EISG,segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/bofu,keysight:product-lines/1h,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/design-and-test-product/power-analyzer,keysight:models/b2/b2912c
如何使用高精度 SMU 評估雙極性電晶體 (BJT) 的性能
利用高精度源極測量單元(Source Measure Units)進行同步電壓供給與電流測量,以評估雙極性接合電晶體的性能。在受控偏壓條件下分析基極與集電極電流響應,藉此評估電晶體的電氣特性。
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