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segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776csegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/n7/n7776c
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利用可調式雷射和可程式化衰減器,自動化執行晶圓級光功率掃描,以進行矽光子學元件特性分析,並以高重複性測量整個晶圓上的損耗、響應度及飽和度。
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