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segmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33622asegmentation:campaign/Digital_General_Purpose,segmentation:product-c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如何驗證系統在訊號中斷後的恢復情況
在可重複的實驗台條件下，利用 Expert 系列桌上型波形與函數產生器，驗證系統在訊號中斷情況下的恢復能力。
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