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segmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/rf,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/meter,keysight:models/e4/e4991bsegmentation:campaign/RF,segmentation:product-category/RF_Testing,segmentation:product-category/RF_Testing/LCR_Meters_Impedance_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/wn,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/develop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透過測量阻抗、相位、電阻、電抗、電容及電感，對電子元件進行跨頻率特性分析。
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