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是德為電子裝置製造商提供領先的電路板測試解決方案，可處理複雜印刷電路板裝配所遇到的各種 PCBA 測試存取和測試範圍問題。

i3070 和 i1000D ICT 在線測試系統提供市場中最高的投資報酬率（ROIC），可改善電路板測試範圍和測試速率。

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PCB 測試與檢查服務

PCB 測試與檢查服務

專業的、本地化正常運行時間的支援和端對端的服務，可解決真實世界製造業的挑戰。

自動 ICT 系統

自動 ICT 系統

是德科技擁有超過 30 年的自動在線（in-circuit）測試經驗，可提供最完整的自動在線測試解決方案，包括小巧的內部和外部整合式在線測試機械手臂。

在線測試 > Medalist i1000 系統

在線測試 > Medalist i1000 系統

Keysight Medalist i1000 在線測試（ICT）系統是一套經濟型的在線測試解決方案，具備了數位測試功能並同時保留其原本的低成本測試夾具解決方案。

Medalist i3070

Medalist i3070

新一代內電路測試系統 Medalis i3070，能以無與倫比的測試涵蓋範圍和穩定性，提高 20% 以上的輸出，擴大了世界上最行之有效的 ICT 系統之效能。

3070AF ICT i3070 Accessories : Fixture

3070AF ICT i3070 Accessories : Fixture

View ICT i3070 fixture accessories ranging from fixture kits to vectorless test items like VTEP . You can conveniently select items/parts to request for a QuickQuote

N1125A x1149 Boundary Scan Analyzer

N1125A x1149 Boundary Scan Analyzer

Electrical structural test and programming tool based on IEEE 1149.x standards for boundary scan / JTAG technology.
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Featured Resources

Brochures 2015.01.31

In-Circuit Test Suite

In-Circuit Test Suite

Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

2015.01.31

Application Notes 2020.07.13

New i3070 Series 6 is 1.5x faster!

New i3070 Series 6 is 1.5x faster!

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2020.07.13

Application Notes 2021.06.07

Vectorless Test: nanoVTEP vs VTEP

Vectorless Test: nanoVTEP vs VTEP

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2021.06.07

Application Notes 2019.06.17

Reducing Downtime Remotely with Keysight On-Site Now!

Reducing Downtime Remotely with Keysight On-Site Now!

With Keysight’s On-Site Now service, quicker expert consultants can respond and resolve your production issues faster and reduce downtime. Learn more.

2019.06.17

Application Notes 2019.10.20

i3070 In-Circuit Tester (ICT) – Industry 4.0 Ready

i3070 In-Circuit Tester (ICT) – Industry 4.0 Ready

Keysight’s plug and play i3070 In-Circuit test system supports Industry 4.0 machine to machine communication protocol of IPC-CFX standards and more.

2019.10.20

Technical Overviews 2017.11.30

Electronic Components Tolerance and Test Limits for In-Circuit Test

Electronic Components Tolerance and Test Limits for In-Circuit Test

In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

2017.11.30

Article Reprints 2017.05.07

Early Design Review of Boundary Scan in Enhancing Testability and Optimization of Test Strategy

Early Design Review of Boundary Scan in Enhancing Testability and Optimization of Test Strategy

With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

2017.05.07

Technical Overviews 2014.07.30

Electronic Manufacturing Test Cooperative Support Service for Self-Maintainers

Electronic Manufacturing Test Cooperative Support Service for Self-Maintainers

This user’s guide has been prepared for customers who participate in EMT Cooperative Support Service for Self-Maintainers. The guide focuses primarily on information necessary for participants to effectively utilize the service.

2014.07.30

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