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segmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509bsegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/industry/semiconductor,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:models/33/33509b
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模擬複雜的類比通訊波形，以進行可重複的通訊電路測試，並評估振幅、時序、失真及頻譜響應。
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