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segmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212asegmentation:campaign/Bench,segmentation:product-category/DMMs_DAQs_Function_Generators,segmentation:product-category/DMMs_DAQs_Function_Generators/Function_Generators,segmentation:business-unit/EISG,keysight:product-lines/gm,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/waveform-and-function-generators,keysight:dtx/solutions/facets/workflow-stage/design,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ed/edu33212a
如何在設計初期模擬感測器輸入
在硬體尚未就緒的初期設計階段，可利用 Essential 桌上型波形與函數發生器模擬感測器輸入訊號。
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