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Bundle with Select Modules and Save

Take advantage of our 15% bundle discount for advanced non-volatile memory tests when you purchase the semiconductor device analyzer and its modules.

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Save Now on Semiconductor Analyzer Mainframe

Save 30% on the semiconductor device analyzer mainframe to accelerate the research and study of advanced devices.

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本半導體元件特性分析儀器系列使用不同的方法，滿足今日多樣化的使用者需求。

本頁內容：摘要 · 服務比較 · 相關服務 · 產品與服務

摘要

新手和進階使用者皆可使用的完整參數測試解決方案

是德的半導體參數/元件分析儀系列，可同時提供傳統和嶄新、工作導向的元件特性分析方式，以因應今日使用者種種不同的需求。具有深入硬體知識的資深使用者，會很讚賞 Keysight 4155/4156/4157 儀器的傳統參數分析儀功能。這些儀器對於已經專門為這些產品建立好演算法和軟體，卻不覺得有必要變更的現有使用者而言，是很好的選擇。對複雜硬體較不熟悉的新使用者，會發現 B1500A 以應用程式為主的量測方式，是一種直覺式、簡易使用的元件特性分析方式。

服務比較

分類 產品 PC 控制器
配置		 軟體
測試外殼		 測試
方法		 可用的 MFCMU 支援的 SCUU 支援的 ASU
  半導體參數分析儀系列 4155C、4156C、4157B 外部 Keysight I/CV 3.0 由下而上 (Buttom-up) 無 無 有 (4157B)
  半導體元件分析儀系列 B1500A 整合 Keysight EasyEXPERT 由上而下 (Top-down) 有 (B1500A) 有 (B1500A) 有 (B1500A)

Find the series That's Right for You

精密型電流電壓分析儀

精密型電流電壓分析儀

功能強大的特性分析軟體和內建 SMU 的精密型電流電壓分析儀，確保證準確且高效率的電流電壓量測，讓您能清楚洞察各式各樣應用的特性。

低洩漏開關矩陣系列（Keysight B2200A/B2201A/E5250A）

低洩漏開關矩陣系列（Keysight B2200A/B2201A/E5250A）

低洩漏開關主機解決方案可在半導體參數分析儀和晶圓之間運作，以便提供自動化特性分析功能，進而降低測試成本（Keysight B2200A、B2201A 和 E5250A）。

功率元件分析儀 / 曲線追蹤儀

功率元件分析儀 / 曲線追蹤儀

不同的功率元件分析儀可提供不同的電壓與電流範圍，以滿足多樣化的元件分析需求，例如 IGBT、超結 MOSFET、功率 MOSFET、晶體限流器、GTO、二極體等等。提供電容和閘極電荷以及 IV 量測功能。

Related Use Cases

如何評估 LED 的 IV 特性

如何評估 LED 的 IV 特性

執行高能效 LED 的電流與電壓特性分析時，需要產生並量測電流與電壓的功能。 了解如何僅使用電源量測設備來評估二端和三端元件的 IV 特性。
How to Bias Multiple Quantum Qubits

How to Bias Multiple Quantum Qubits

Supplying DC bias voltage to control multiple qubits in quantum computing development requires maintaining the integrity of the qubits by preventing qubit decoherence. Learn how to characterize qubits with low-noise voltage supply and source meter placements with respect to the cryostat.
How to Evaluate IV Characteristics of Solar Cells

How to Evaluate IV Characteristics of Solar Cells

Characterizing the IV properties of solar cells requires extensive current and voltage measurement capabilities across all four measurement quadrants. Learn how to evaluate solar cells by performing tests, such as short circuit current, open circuit voltage, and maximum power point measurements, with a source / measure unit.
How to Make Resistance Measurements

How to Make Resistance Measurements

Resistance measurements require eliminating error-inducing factors, such as residual test lead resistance, thermal electromotive force, and leakage currents in the measurement path. Learn how to address these measurement issues using a remote sense function (4-wire connection), offset compensation, and a guard function.
如何分析低功率積體電路的特性

如何分析低功率積體電路的特性

量測低功率 IC 的電流/電壓特性時，需使用各種基礎儀器，包括多個電源供應器、數位萬用電錶（DMM）、脈衝產生器和數位轉換器。 了解如何使用單一電源量測設備（SMU），快速有效地分析低功率 IC 的特性。
如何測試寬能隙半導體

如何測試寬能隙半導體

在分析寬能隙半導體（WBG）特性時，您需同時測試靜態和動態參數，避免在切換暫態時造成損耗。 了解如何以可重複的方式對 WBG 元件執行 JEDEC 測試，包括開啟/關閉、切換和其他標準測試。
See all use cases

Featured Resources

應用說明 2018.04.08

Accelerate the development of Next Generation Non-Volatile Memory

Accelerate the development of Next Generation Non-Volatile Memory

You can accelerate the development of next generation non voltile memory; CX3300 series for visualizing the fast switching characteristics, B1500A for basic IV,CV,pulsed IV and reliability testing.

2018.04.08

Case Studies 2022.11.08

Improving Reliability of Semiconductor Devices

Improving Reliability of Semiconductor Devices

Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

2022.11.08

Flyers 2014.07.30

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation

This is a flyer targeting business opportunities for solar cells / modules and will be used by FEs and AEs generate business leads. Most of existing instrument products in HSTD are related to this flyer.

2014.07.30

Technical Overviews 2023.03.28

B1500A Semiconductor Device Analyzer

B1500A Semiconductor Device Analyzer

This technical overview describes the complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement using the B1500A semiconductor device analyzer.

2023.03.28

Application Notes 2019.10.08

DC MOSFET Characterization at the Wafer Level

DC MOSFET Characterization at the Wafer Level

This application note discusses the use of the B1500A semiconductor device analyzer for ultra low current DC MOSFET characterization at the wafer level.

2019.10.08

Technical Overviews 2017.11.30

Challenges and Solutions for Material Science/Engineering Testing Applications

Challenges and Solutions for Material Science/Engineering Testing Applications

This technical overview introduces Keysight solutions for material science and engineering test applications.

2017.11.30

Application Notes 2023.01.02

IV and CV Measurement Using the B1500A MFCMU and SCUU

IV and CV Measurement Using the B1500A MFCMU and SCUU

This eight-page application note illustrates how an accurate IV and CV measurement system can be configured using the B1500A MFCMU and SCUU.

2023.01.02

Success Stories

Case Studies 2022.11.08

Improving Reliability of Semiconductor Devices

Improving Reliability of Semiconductor Devices

Automation of random telegraph noise measurement (RTN) is now possible using the B1500A's waveform generator/fast measurement unit (WGFMU) module and WaferPro Express.

2022.11.08

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