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Explore dual-channel and ultra-wideband signal analysis for demanding RF workflows.
Get faster, clearer insights with our new multicore, 12-bit oscilloscope up to 33 GHz. Trade in your old oscilloscope and get credit toward a new XR8.
Bridging design and physical testing to evaluate drop, impact, shock, and vibration compliance before hardware exists.
Unlock your free upgrade to the next bandwidth tier.
Strengthen 1.6T network reliability for AI-scale workloads from transceivers to interconnects.
Pair Keysight VSA software with the new XA5 signal analyzer for advanced visualization, demodulation, and analysis — start your 30-day trial today.
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
Explore end-to-end workflows spanning IC design, validation, wafer test, and photonics.
Explore curated support plans, prioritized to keep you innovating at speed.
Maximize accuracy and performance with precision accessories engineered for Keysight instruments.
Purpose-built solutions engineered for the design and test challenges unique to your industry.
Use Cases mapped to every stage of your product lifecycle, from design through operations.
Success Stories
Authoritative application notes, data sheets, reference designs, and test procedures to accelerate design and validation decisions.
Hands‑on bootcamps that teach system design, test methods, and production workflows engineers can apply immediately.
Learning Hub
Explore methodologies, test strategies, and technical resources for designing, validating, and scaling AI systems and networks.
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E9901E i307x Series 5 提供充足的節點,可用於在小型測試儀中測試小型電路板。此系統採用與前一代 E9901D i307x 系統相同的易用型 GUI(圖形操作介面)。自第一款 Series 1 3070 測試系統上市以來,該系統在數十年間,一直維持著出色的可攜性、可靠性和穩定性(TRS),並提供當今元件要求使用低電壓測試的能力。
所有 i3070 Series 5 測試系統均加入新的基礎架構,以便更靈活地添加、控制並連接外部電子裝置或儀器。它可將外部電子裝置插入測試頭端(testhead),如同已將該裝置整合入系統中。外部電子裝置可是功能性測試電路,以便為 ICT 提供額外的功能測試範圍,或者為待測裝置提供額外的激發,以改善測試覆蓋範圍。外部電子裝置控制、測試順序和測試結果,仍需透過 BT-BASIC 測試計畫來實現,並透過使用者熟悉的測試頭端 PC 控制器來執行。
為了支援增強的效能,PCBA 如今擁有更高的電流要求,因此可透過測試儀向待測裝置送入 10 A 的電流。電源埠也可經過多工處理,所以一個電源供應器最多可對一個面板中不同的 6 個電路板供電,每個電源通道都由一個繼電器控制,以保護待測裝置。
i3070 Series 5 測試系統包含新的類比激發和量測裝置(ASRU),可將類比測試速度提高 20%,進而提高整體測試速率。
該測試系統還包含先前版本的受限存取測試工具。
如果您的小型電路板需要進行速度更快、在受限區域中具有更高測試覆蓋率的測試,E9901E i307x Series 5 系統將是最佳選擇。
閱讀更多關於 i3070 Series 5 的資訊。
** 個模組的 pin 卡總數不能超過 9 個。
閱讀更多關於 i3070 的特性與優勢。
欲獲得更多資訊,請看產品資訊。