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i3070 In-Circuit Test System Software
Experience enhanced testing capabilities with i3070 In-Circuit Test System Software
Improve your i3070 in-circuit test system's test performance with advanced software that increases test throughput and coverage. Expand your testing capabilities and optimize your manufacturing process with these powerful tools.
Our software licenses include the following:
- Advanced Throughput Multiplier, which can save up to 50% of test time.
- Native testing software licenses for boundary scan-related tests that cover IEEE 1149.1 and 1149.6 standards.
- Keysight's Cover Extend Technology (CET) for extending test coverage to non-boundary scan devices using nanoVTEP and CET Signal Conditioner Card.
- Silicon Nails feature uses boundary scan device drivers and receivers to test non-boundary scan devices connected to the chain flashing test capability through Flash ISP and PLD ISP features.
- DGN Advanced Reporting feature for diagnostic testing.
- Yearly software updates for test development and runtime to keep your testing up-to-date.
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Boundary scan is a method for testing interconnections on printed circuit boards. Keysight’s Interconnect Plus Boundary Scan feature enables all the tools required to develop and execute this foundational test method on the board under test.
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
Keysight’s Silicon Nails feature enables all the tools required to develop and execute tests on non-compliant boundary scan devices that are connected to boundary scan compliant devices on the printed circuit board.
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
Cover-Extend Technology (CET) extends the Boundary Scan limited access solution on non-boundary scan devices with the use of VTEP or nanoVTEP and CET signal conditioner card hardware.
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
The Flash ISP feature enables in-system programming that is usually executed through a flash player application that drives the MCU to execute the programming onto the flash device.
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
The Basic Diagnostics levels is the main troubleshooting tool used by all users to check the hardware configuration, and verify and isolate hardware failures. Some Diagnostic tests require that a Pin Verification Fixture be installed on the system.
Software Update for test development is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
Software Update for testhead is a service that allows the user to get the latest software revisions for their Keysight In-circuit Test Systems.
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
邊界掃描是一種測試印刷電路板互連的方法。 利用是德科技 Interconnect Plus 邊界掃描功能，您可使用所有必要的工具，在待測板上開發並執行這個基本測試方法。
利用是德科技 Interconnect Plus 邊界掃描 1149.6 功能，您可使用所有必要的工具，在待測板上開發並執行此測試方法。 與 1149.1 標準相比，1149.6 標準定義了邊界掃描裝置的測試方法，這些裝置採用交流耦合信號或差動網路進行設計，以支援裝置的高速運作。
是德科技 Silicon Nail 功能提供在印刷電路板上，連接到邊界掃描相容元件的不相容邊界掃描元件上，開發測試系統並執行測試所需的必備工具。
利用進階量測速率倍增（Advanced Throughput Multiplier）功能，您可在一台 4 模組測試儀上，同時測試最多 2 個 1,000 至 2,000 節點（介於 1,296 和 2,592 節點之間）的電路板，將測試時間縮短一半。
覆蓋擴展技術（CET）使用 VTEP 或 nanoVTEP 和 CET 信號調節卡硬體，擴展在非邊界掃描裝置上運作的邊界掃描有限存取解決方案。
Drive Thru 功能讓測試開發軟體，能夠在電阻器和元件之間未分配測試點的情況下，對積體電路或連接器進行測試。
Flash ISP 功能可實現線上燒錄，這通常需透過 Flash 播放器應用軟體，來驅動 MCU 進行編程，以便將程式燒錄到快閃記憶體中。
有了 PLD ISP 功能，測試開發工程師可在 VCL 數位測試檔中指定一個配置位元流檔，就像對快閃記憶體進行燒錄一樣。 PLD ISP 功能支援多種 PLD 配置資料格式，包括： 串列向量格式（SVF）、標準測試與程式設計語言（STAPL）、Jam、Jam Byte Code（JBC）目標檔。
基本診斷級別，是使用者用於檢查硬體配置、驗證並隔離硬體故障的主要故障排除工具。 某些診斷測試需在系統中安裝針腳驗證測試夾具。
使用者還可使用 Silicon Nail 測試開發工具定義向量，以便在不相容的邊界掃描元件上執行這些向量。 此測試開發工具會建立邊界掃描測試，然後在相關的互連針腳上進行輸出或輸入，以便產生一致的測試。
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