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Explore dual-channel and ultra-wideband signal analysis for demanding RF workflows.
Get faster, clearer insights with our new multicore, 12-bit oscilloscope up to 33 GHz. Trade in your old oscilloscope and get credit toward a new XR8.
Bridging design and physical testing to evaluate drop, impact, shock, and vibration compliance before hardware exists.
Unlock your free upgrade to the next bandwidth tier.
Strengthen 1.6T network reliability for AI-scale workloads from transceivers to interconnects.
With extra memory and storage, these enhanced NPBs run Keysight's AI security and performance monitoring software and AI stack.
Explore end-to-end workflows spanning IC design, validation, wafer test, and photonics.
Explore curated support plans, prioritized to keep you innovating at speed.
Authoritative application notes, data sheets, reference designs, and test procedures to accelerate design and validation decisions.
Hands‑on bootcamps that teach system design, test methods, and production workflows engineers can apply immediately.
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許多裝置並沒有同軸連接器,因此需置於測試夾具中,以便在同軸環境中進行量測。 您需準確地消除測試夾具效應,才能對待測裝置(DUT)進行有效的量測。 此自動測試夾具效應移除功能新增了強大的應用軟體精靈,以便逐步指引您分析測試夾具的特性,並且在進行量測時消除其效應。