Why Use WaferPro
Automate wafer-level characterization and scale measurement productivity.
Modern semiconductor technologies require large volumes of accurate measurement data collected across multiple devices, wafers, and test conditions. WaferPro streamlines characterization with automated wafer-level measurements, integrated instrument control, and flexible test plan execution.
By consolidating measurement automation, wafer prober control, and data collection into a single workflow, WaferPro helps characterization teams increase throughput, improve measurement consistency, and accelerate the delivery of high-quality data for device modeling and process development.
Key Capabilities
Automate complex wafer-level measurement workflows.
Connect and control instruments with built-in drivers.
Works with leading wafer prober platforms.
Develop customized measurements and data analysis.
Synchronize wafer maps and calibration status.
Analyze high-volume measurement data efficiently.
- Integrated Measurement System (IMS-K-LFN)
Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements.
- Integrated Measurement System IMS-K-DC
Integrated system with Keysight SPA for DC parametric measurements.
- Integrated Measurement System IMS-K-mmW/THz
Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz.
Resources to Get You Started
WaferPro enables measurement automation, wafer prober control, and data ready for modeling. Furthermore, your test plans may be easily scaled across your lab. WaferPro provides a unified measurement platform that eliminates the complexity of software integration, allowing an engineer to set up and execute wafer-level measurements of semiconductor devices. The modern and intuitive user interface propels your lab into the next generation of innovation by reducing necessary set-up steps, thus saving time and money.
Brochures
Global Device Modeling Services
レポート
The Future of Design and Simulation Workflows - Report
Case Studies
Engineering Education Transformed with Keysight Labs
小冊子
RF and Microwave Industry-Ready Student Certification Program
Explore WaferPro Express Bundles
EDA software bundles provide designers with pre-configured combinations targeted to a specific design workflow.
PathWave WaferPro Measurement and Programming
Run automated wafer-level measurements with turnkey instrument drivers and routines. Create Python 3 and PEL programs to execute custom measurement algorithms.
Run automated wafer-level measurements with turnkey instrument drivers and routines. Create Python 3 and PEL programs to execute custom measurement algorithms.
PathWave WaferPro WGFMU 測定
Execute automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU.
Execute automated wafer-level low-frequency noise measurement with turnkey measurement drivers and measurement routines for WGFMU.
PathWave WaferPro A-LFNA 測定およびプログラミング
Execute automated wafer-level low-frequency noise measurements with turnkey measurement drivers and measurement routines for both A-LFNA and WGFMU.
Execute automated wafer-level low-frequency noise measurements with turnkey measurement drivers and measurement routines for both A-LFNA and WGFMU.
Have Questions? We've Got Answers
Device Modeling WaferPro is wafer-level measurement and programming software that automates semiconductor device characterization using integrated instrument control, wafer prober support, and customizable measurement workflows.
WaferPro supports automated measurements of semiconductor devices, including transistor characterization, circuit component testing, DC measurements, RF characterization, and low-frequency noise analysis.
Yes. WaferPro includes a Python 3 programming environment and PEL support, enabling users to create custom test algorithms, automation routines, and data analysis workflows.
WaferPro supports multiple wafer prober manufacturers, including FormFactor and MPI Corporation, allowing integration into a wide range of semiconductor characterization environments.
Turnkey drivers, prebuilt measurement routines, automated test execution, wafer map synchronization, and advanced data management tools significantly reduce setup time and accelerate time to results.