Flexible, expandable and upgradeable modular parametric instrument controlled via I/CV 3.0 Lite software
Ultra low current measurement without external preamplifiers
Flexible to provide stable 100aA measurements
Switch between CV and IV measurement without wasting time swapping cables
Measurement Capabilities
1 femtoamp current measurement resolution without external preamplifiers (High-Resolution SMU)
100 attoamp current measurement resolution using HRSMU with Atto Sense & Switch Unit (ASU)
10 femtoamp and 0.5 microvolt measurement resolution (Medium-Power SMU)
+/- 200 Volts and +/- 1 Amp output by High-Power SMU
I/CV 3.0 Lite Software Capabilities
Drivers for all of the popular semiautomatic wafer probers
Intuitive GUI-based switching matrix control for the B2200A, B2201A, and E5250A
Test sequencer for automating testing across an entire wafer
Post-test graphical analysis and wafer mapping capability
The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.
