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Using Mixed-Signal Oscilloscopes for DDR4/LPDDR4 Test

Using Mixed-Signal Oscilloscopes for DDR4/LPDDR4 Test

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With increasing data rate speeds, more complex testing methodology, and shrinking margins, memory designers and engineers face new challenges when debugging and validating their memory designs. The JEDEC LPDDR4 specification has a maximum data rate of 4266 MT/s, requiring you to pay more attention to high-speed signal integrity issues. The complex testing methodologies included in both the DDR4 and LPDDR4 specifications require more than the standard setup and hold time measurements commonly used for testing. Smaller margins mean you must venture through bit error rate (BER) measurements when validating eye margins to ensure compliance.

This application notes describes how you can meet these challenges and make fast, accurate DDR4/ LPDDR4 measurements by using a Keysight Infiniium Mixed-Signal Oscilloscope (MSO).

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