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Slashing Debugging Time with the Medalist i3070 In-Curcuit Test AutoDebug Tool

アプリケーションノート

With the Keysight Technologies, Inc. Medalist i3070, unpowered passive analog components can be auto‑ matically debugged with the click of a button, signiicantly slashing the time an engineer traditionally used to spend to debug a new ICT program. This AutoDebug tool is accessible from the graphical debug interface. It is an essential and useful feature that can help new engineers with limited ICT and circuit analysis experience perform analog debugging effectively.

 

With AutoDebug, the user can inetune analog unpowered tests using a set of rules that can be modiied so that the analog tests or boards pass reliably in production. Comprehen‑ sive and predeined sets of rules are provided for each device type. The rules mimic the actions that an engi‑ neer will need to carry out during the debug or ine-tuning process for each component type, hence enabling debug accuracy. Statistical measures with Cpk process capability indices are employed to determine the sta‑ bility of the tests. Upon running the selected test, the tool captures mea‑ surement data, evaluates the data, adds or deletes measurement options and compiles the tests, thus reducing the time it takes to get a new test debugged and running in the actual production environment.

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