P9400A/C Solid State PIN Diode Transfer Switches

Key Features

• Minimize crosstalk with exceptionally high port-to-port isolation of > 80 dB
• Increase test setup flexibility with a broad operating frequency range
• Increase throughput effectively with high-speed switching time of < 200 ns
• Optimize system dynamic range with low insertion loss
• Eliminate the need for external drivers with integrated TTL-compatible driver

Description

The Keysight Technologies, Inc. P9400A/C solid state PIN diode transfer switches offer outstanding performance in isolation, insertion loss and return loss across a broad operating frequency range. Based on PIN diode technology, P9400A/C fit exceptionally well into ultra-fast RF and microwave switching applications in instrumentation, communications, radar, switch matrices and various other test systems where speed and lifetime of a switch are critical.

A PIN diode switch IC and multiple shunt PIN diodes on the RF path of the P9400A/C ensure unmatched isolation performance between ports. Keysight’s careful selection of the PIN diodes provides accurate low frequency measurements down to 100 MHz, while maintaining superb performance up to 8 GHz (P9400A) and 18 GHz (P9400C).

P9400A/C have an integrated TTL-compatible driver for easy operation. These transfer switches increase system flexibility and are useful in systems where superior RF perfor­mance switches is critical.

Applications

Keysight P9400A/C solid state transfer switches can be utilized in numerous ways to enhance system flexibility and simplicity. The fol­lowing are five examples of how the P9400A/C switches can be used: as a drop-out switch, as an SPDT switch, for signal reversal, to bypass an active device, and to switch between multiple equipment to multiple DUTs. The P9400A/C can be used as a simple drop-out switch where a signal is either run through the device or straight through the switch bypassing the device.

By attaching an external termination, you can use the P9400A/C in an SPDT terminated switch configuration.

In the signal reversal configuration, a device can be connected across two diagonal ports of the P9400A/C transfer switch. This will allow the signal direction through the device to be reversed.

In Figure 5, an active device, such as an amplifier, is inserted into a signal path. This presents a unique problem. A single transfer switch has the undesirable characteristic of shorting the output of the amplifier to its input when the signal is bypassing the amplifier. Two transfer switches are used in this example instead of two SPDT switches, which can serve the similar purpose. However by using two transfer switches, an additional signal path is always simultaneously available.

Figure 6 shows an example of a configuration of transfer switches that tests two DUTs simultaneously, each through different sets of equipment targeting distinctive measurement parameters.

DUT 1 is tested for S-parameters using a network analyzer, while DUT 2 is tested on harmonics and spurious signals using a signal generator and spectrum analyzer. Examples of devices that can be conveniently tested this way include: amplifiers, mixers and receivers. With only one TTL control input that controls both switches’ control pin, both tests can be run simultaneously and efficiently on both DUTs. This type of usage will increase throughput and simplify your test system.

Besides being versatile, P9400A/C switch’s outstanding isolation is evidently portrayed in this application example. Assume that the transmitted power coming out from DUT 1 is –30 dBm. At the same time, DUT 2 is tested on spurious signal, which might be measured to a value as low as –100 dBm or more. This requires switch #2 to have an isolation of more than –100 dBm — (–30 dBm) = –70 dB, which is fulfilled by the isolation performance of P9400A/C.

This is only one of the countless measurement uncertainties that need careful attention. You do not want your system’s accuracy to be impaired by switches with low or even moderate isolation performance. Nor do you want to waste extra time calculating for the uncertainties which always lead to even more complexities due to the precise timing required in the ever-increasing speed of switching and testing.