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This application note provides valuable measurement technique information for engineers and technicians that want to make the most accurate vertical and timing measurements possible using a high-speed, real-time Digital Storage Oscilloscope (DSO).
When making critical signal integrity measurements of high-speed digital signals, it may be necessary to measure the small aberrations on the top and bottom of the signals. Examples of these measurements include overshoot, undershoot, and overall ripple. A common technique often employed by oscilloscope users to increase the effective resolution and accuracy of these types of measurements is to offset the signal under test and then increase the vertical sensitivity around the waveform portion of interest. This will spread out the small aberrations of the signal over a larger range of the scope’s A/D converter.
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