Extraction routines that are fully automated, fast, efficient and easy-to-use, taking advantage of the latest enhancements and new features of the IC-CAP
Note: Model number 85195B has been obsoleted.
The information below is provided for reference only.
The 1/f noise or Flicker noise is an important noise source generated at low frequencies. Accurate measurement and modeling of 1/f noise for deep sub-micron CMOS, BJT, FET and HBT devices as well as RF passive components are critical to RF circuit designs.
For example, the 1/f noise shows up as phase noise in an oscillator design where it mixes to the oscillation frequency, causing the oscillator unstable. A noisy local oscillator signal can degrade a receiver's useful dynamic range and selectivity, making it difficult to recover a signal buried in the noise.
The 1/f noise package provides an open and flexible extraction routine in IC-CAP. The model file contains setups and wizards that automate your measurement and extraction process, making it a push-button solution. For example, the GUI layer invokes dialogues that guide you step-by-step through the entire process of measurement, extraction, and simulation.