Simultaneous all-optical measurement of loss (IL) / return loss (RL), polarization dependent loss (PDL), group delay (GD) and different group delay (DGD)
Application-Programmable Interface (API) for custom analysis, remote control and automation, and integration with simulation software solutions
All measurements made in swept-wavelength mode for shortest test time at picometer wavelength resolution
Software-enabled multi-port testing and new noise threshold feature for more convenient analysis of multichannel devices
The Keysight 81910A enables exhaustive analysis of advanced photonic devices, covering all physical properties relevant to DWDM components in a single solution:
Simultaneous all-optical measurement of loss (IL) / return loss (RL), polarization dependent loss (PDL), group delay (GD) and different group delay (DGD)
Display of chromatic dispersion (CD) and polarization mode dispersion (PMD)
Simultaneous transmission and reflection measurement
All measurements made in swept-wavelength mode for shortest test time at picometer wavelength resolution
Accurate loss and GD results by calculation from the true average of their polarization dependency
The unique combination of Mueller Matrix method for loss measurement and Jones matrix method for interferometric dispersion measurement yields best accuracies in all axes
Software release 2.70 provides: enhanced speed, measurement of devices up to 120 m long, and up to 120 nm Wavelength sweep!
