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B1505A Power Device Analyzer / Curve Tracer


The B1505A can handle all types of power device evaluation, with features that include a wide voltage and current range, fast pulsing capability (10 μs), μΩ level on-resistance measurement resolution, and sub-pA level current measurement capability. In addition, an oscilloscope view permits visual verification of current and voltage-pulsed waveforms.

Two independent analog-to-digital (A/D) converters on each channel support a 2 μs sampling rate to monitor the critical timings that can affect device behavior accurately.

It can also perform fully automated capacitance measurements (such as Ciss, Coss, and Crss) at high voltage biases (up to 3 kV). Moreover, it can also evaluate gate charge (an important parameter for high-frequency switching converter efficiency) at up to 3 kV.

The B1505A with EasyEXPERT group+ software includes a curve tracer mode that combines familiar curve tracer functionality with the convenience of a PC-based instrument; this makes it easy for traditional curve-tracer users to become productive quickly.

Module selector, device capacitance selector, and Quick Test feature enable fully automated measurement on multiple parameters without re-cabling.

Keysight EasyEXPERT group+ GUI-based characterization software is available either on the B1505A’s embedded Windows 10 platform with a 15-inch touch screen or on your PC to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management, either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober.

EasyEXPERT group+ makes it easy to perform complex device characterization immediately with hundreds of ready-to-use measurements (application tests) furnished and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. The net result is improved ease of use, better data analysis, and simplified data management to measure power devices and power circuitry.

Basic features

Precision measurement across a wide range of operating conditions

  • All-in-one solution for power device characterization up to 1500 A/10 kV
  • Medium current measurement with high voltage bias (e.g., 500 mA at 1200 V).
  • μΩ resistance measurement capability
  • Accurate sub-picoamp level current measurement at high voltage bias
  •  Fully automated thermal test from -50 to +250 °C

Extensive device evaluation capabilities

  • Fully automated Capacitance (Ciss, Coss, Crss, etc.) measurement at up to 3000 V of DC bias
  • High-power pulsed measurements down to 10 μs
  • Gate charge measurement covering Nch MOSFETs and IGBTs both in a package and on a wafer
  • High voltage/high current fast switch option to characterize GaN current collapse effect
  • Up to 5 high voltage (3 kV) source/measure unit channels for reliability applications
  • Perform both hot and cold temperature dependency testing in an interlock-equipped test fixture
  • Support SiC MOSFET Vth, BTI-Vth measurements based on the JEDEC standards

Improved measurement efficiency

  • Switch between high-voltage and high-current measurements without the need to re-cable
  • Automated reconfiguration of test circuitry for transistor capacitance measurement (Ciss, Coss, Crss, Cgs, Cgd, Cds, etc.) for both packaged and on-wafer devices
  • Standard test fixtures with interlock for safe packaged power device testing
  • Supported and secure on-wafer high-power
  • The Oscilloscope view allows verification of applied voltage and current waveforms
  • MS Windows-based EasyEXPERT group+ software facilitates data management and simplifies data analysis

Upgradable and scalable hardware architecture

  • A wide selection of measurement modules
  • Support for high-power devices with up to 6 pins

Specification conditions

  • The measurement and output accuracy are specified under the conditions listed below. Note: The SMU measurement and output accuracies are specified at the SMU connector terminals, using the Zero Check terminal as a reference.
  • Temperature: 23 ± 5 °C
  • Humidity: 20 to 70%
  • Self-calibration after a 40-minute warm-up is required.
  • Ambient temperature changes less than ±1 °C after self-calibration execution. (Note: This does not apply to the MFCMU).
  • Measurement made within one hour after self-calibration execution. (Note: This does not apply to the MFCMU).
  • Calibration period: 1 year
  • SMU integration time setting: 1 PLC (1 nA to 1 A range, voltage range), 200 μs (20 A range). Averaging of high-speed ADC: 128 samples per 1 PLC
  • SMU filter: ON (for HPSMU and MPSMU)
  • SMU measurement terminal connection: Kelvin connection (for HPSMU, MPSMU, HCSMU, and MCSMU), non-Kelvin (for HVSMU)


The B1505A is a highly versatile power device evaluation tool with advanced features such as fast pulsing, high voltage bias measurements, and automated capacitance measurements. It also includes EasyEXPERT group+ software for efficient and repeatable device characterization, with hundreds of ready-to-use measurements and a built-in database for storing test conditions and measurement data.

If you need a reliable and powerful tool for power device evaluation and characterization, consider the B1505A with EasyEXPERT group+ software. It can help you efficiently perform complex measurements, improve data analysis and management, and ultimately accelerate your device development and testing



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