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應用說明
This application note introduces the threshold voltage (Vth) evaluation methods for SiC power MOSFETs based on the JEDEC publication - JEP183 and its related Keysight solutions.
Keysight offers two solutions for the Vth measurement on the SiC MOSFET that JEP183 describes.
• The B1505A (B1506A) with the JEP183 dedicated Application Tests implemented in the EasyEXPERT group+ software allows easy and accurate SiC Vth evaluation. In addition, the UltraHigh Current Unit (UHCU) and the High Voltage SMU (HVSMU) enhance the measurements in combination with the High-Voltage (HV) and the High-Current (HC) stress.
• The B2900B series SMU with the PathWave IV Curve Measurement Software allows faster measurements beyond the JEP183 requirements at a lower cost. However, some restrictions exist, such as no SiC Vth dedicated GUI nor Vth extraction capability and limited I/V range.
You can select the appropriate solution considering the conditions such as simplicity, scalability, cost, etc.
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