N7742C and N7743C Optical Power Meters
資料表
With the new N7742C and N7743C, Keysight extends the functionality of the popular N774-C optical power meter family. These new instruments offer models for wider wavelength range, higher power levels, analog feedback and finer granularity of port count, while keeping the speed and logging performance of the well established N7744C and N7745C.
In addition to the standard operating wavelength range of 1250 nm to 1650 nm for both N7742C and N7743C (options #200, #400), this can be extended down to 800 nm with options #210 and #410. All N7742C and N7743C optical power meters provide an analog voltage output that can be used as feedback for automated alignment applications. The voltage on each channel’s analog output port is configurable to be linearly or logarithmically proportional to the optical power level. The new logarithmic mode is very helpful for tracking the signal level over a wide dynamic range, like during probe adjustment.
For measuring optical power levels above +10 dBm, the N7743C is a good fit to devices like transmitter lasers, with +20 dBm maximum input power. The dark noise level is less than 30 pW, providing over 90 dB dynamic range. This provides an intermediate performance alternative to the remote heads, like the 81626C or 81628C that cover still higher power levels.
Both, N7742C and N7743C are available with two (option #200, #210) or four power sensor channels (option #400, #410). The connector style can be configured individually for each port by choosing from a range of user-exchangeable N7742-I connector interfaces.
The N7742C and N7743C benefit from the N77-C’s family-wide, common trigger concept, and a modern, browser-accessible user interface, that makes it convenient to configure the instrument’s functionality. High-speed measurement data acquisition, faster data interfaces, the use of dual-ported RAM for uninterrupted simultaneous measurement and readout, and fast power range switching help avoid unnecessary delays in the measurement process as well as in post-processing.