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Highlights

The Keysight 4881HV high-voltage wafer test system is a breakthrough solution for parametric tests up to 3 kV, supporting high voltage (HV) and low voltage (LV) in one pass.

  • Configure the HV-switching matrix with up to 29 pins and 3 kV flexibly on any output pin.
  • Combine HV and LV source / measure units to enable accurate current-voltage measurement down to sub-pA resolution.
  • Make high-voltage capacitance measurements with up to a 1 kV DC bias.
  • Meet regulatory needs such as factory mandates and SEMI S2 compliance.
  • Get support for 200 mm / 300 mm prober and factory automation.

Extend the Capabilities of Your 4881HV High Voltage Wafer Test System

Featured Parametric Test System Resources

Brochures 2024.10.03

4881HV High Voltage Wafer Test System

4881HV High Voltage Wafer Test System

4881HV High Voltage Water Test System enables to perform process control monitoring and wafer acceptance testing in manufacturing up to 3 kV to meet the future requirements of applications such as automotive.

2024.10.03

Brochures 2021.04.01

4080 Series Parametric Testers

4080 Series Parametric Testers

This brochure provides hardware, software, and service information for the 4080 Series Parametric Test System, a total solution for high-throughput testing.

2021.04.01

Flyers 2021.06.24

SPECS & SPECS-FA - Parametric Test System Software for 4080 Series

SPECS & SPECS-FA - Parametric Test System Software for 4080 Series

This literature provides the brief overview of SPECS software for parametric test systems.

2021.06.24

Technical Overviews 2017.11.30

Low Current Measurement Technologies in 4080 Parametric Test System

Low Current Measurement Technologies in 4080 Parametric Test System

This technical overview describes how the 4080 series parametric test systems attain such ultra-low current measurement performance and high throughput.

2017.11.30

Application Notes 2017.12.01

Making Component Matching Measurements in IC Design

Making Component Matching Measurements in IC Design

This application note addresses the issue of component matching and explains how to use Keysight parametric test systems to make component matching measurements.

2017.12.01

Application Notes 2017.12.01

Accurate Capacitance Measurement with a Wafer Prober

Accurate Capacitance Measurement with a Wafer Prober

Parametric test systems perform accurate capacitance measurements. Learn how to do accurate wafer level characterization using a 4080 Series with a wafer prober.

2017.12.01

Application Notes 2017.11.30

Accurate and Efficient Frequency Evaluation of a Ring Oscillator

Accurate and Efficient Frequency Evaluation of a Ring Oscillator

Read about a precise and fast measurement method to measure the oscillation frequency of a ring oscillator structure using a spectrum analyzer in the 4080 series tester.

2017.11.30

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