Cost-effective, scalable systems for reliability and parametric tests for modern manufacturing
Keysight's Advanced Scalable Unified Reliability (ASUR) family of reliability test products provides a range of solutions for different needs, budgets, experience levels and strategies. The Single Device Reliability (ASUR SDR) product provides a PC and instruments-based solution for single device-at-a-time reliability testing with modest equipment investment using proven reliability test algorithms. ASUR PDR is a high-performance, low-cost, accelerated reliability and parametric solution for parallel multi-site testing that incorporates the proven accelerated techniques of Core Wafer Systems PDQ-WLR using instruments-based solutions. ASUR PDR is part of the ASUR scalable set of solutions: one hardware, one software, from instruments to systems, on-wafer to package.
ASUR PDR makes the measurements your technology needs
ASUR PDR provides parallel, multi-site, on-wafer or packaged DC and AC/Pulsed TDDB, BTS, HCI, N/PBTI and EM long term reliability tests. Advanced features allow detection of novel effects found in advanced materials such as high-k and low-k dielectrics, copper and transition silicide barrier metallization. In dielectric reliability ASUR PDR can use advanced adaptive scanning and specialized failure detection methods to zero in on relevant operating regimes and identify soft breakdowns. In BTI, ASUR PDR executes fast measurements for proper detection and avoids relaxation effects.
Reliability test with confidence
JEDEC Standard reliability test algorithms in ASUR are in their fifth generation. This suite is a fully tested and supported with over 10 years of in-field experience and validation.