DS1203A High Precision Electromagnetic Probe Tips User Manual
Publication Number: DS1203-90003
Publication Date: 2025.01.27
Language: English
User Manuals

DS1203A High Precision Electromagnetic Probe Tips User Manual

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The High Precision Electromagnetic Probe Tips are used for electromagnetic fault injection (EM-FI) attacks on semiconductor targets, for example smart cards. The tips are designed to fit on the Unidirectional Fault Injection Probe and are easily replaceable.

In this user manual, get details about the following topics:

  • What it does
  • EM-FI Classic probe tip
  • EM-FI High Precision tips
  • EM-FI Crescent probe tip
  • EM-FI BBI probe tip
  • EM-FI BBI probe tip advance feature
  • Help and troubleshooting
  • Technical specifications