PathWave Test Sync Executive: Real-Time Pulsed Characterization of a Device-Under-Test
Publication Number: 9018-18194.EN
Publication Date: 2020.08.14
Language: English
Programming Guides

PathWave Test Sync Executive: Real-Time Pulsed Characterization of a Device-Under-Test

Show Description

In KS2201A - Programming Example 4, an M3202A AWG and an M3102A digitizer are used to perform a real-time pulsed characterization experiment on a Device-Under-Test (DUT).