Choose a country or area to be content specific to your location

    開啟瀏覽器cookie以提升網站功能與效能。
    Keysight Technologies
    Toggle Menu
    即時對談
    聯絡我們
    Welcome

    歡迎登入

    • 我的資料
    • 登出
    • 會員登入
    • 註冊
    索取報價
    中國臺灣

    確認您的國家或地區

    中國臺灣

    • 中国
    • 日本
    • 繁體中文
    • 한국
    • Россия
    • Brasil
    • Canada
    • Deutschland
    • France
    • India
    • Malaysia
    • United Kingdom
    • United States
    • Australia
    • Austria
    • Belgium
    • Denmark
    • Finland
    • Hong Kong, China
    • Ireland
    • Israel
    • Italy
    • Mexico
    • Netherlands
    • Singapore
    • Spain
    • Sweden
    • Switzerland (German)
    • Thailand
    • 更多..

    請確認

    確認您的國別以取得相關報價、產品促銷訊息、活動訊息,以及聯絡資訊。

    • 產品與服務
      • 示波器與分析儀
        • 示波器
        • 頻譜分析儀(信號分析儀)
        • 網路分析儀
        • 邏輯分析儀
        • 協定分析儀與模擬器
        • 誤碼率測試儀
        • 雜訊指數分析儀與雜訊信號源
        • 高速數位轉換器和多通道資料擷取解決方案
        • 交流電源分析儀
        • 直流電源分析儀
        • 材料測試設備
        • 元件電流波形分析儀
        • 半導體參數/元件分析儀系列
      • 儀錶
        • 數位萬用電錶(DMM)
        • 相位雜訊量測
        • 功率錶和功率感測器
        • 53200 Series RF and Universal Frequency Counter / Timers
        • LCR 錶和阻抗量測產品
        • B2980A 系列 Femto/Pico 微電流錶和靜電錶/高阻計
      • 產生器、信號源、電源
        • 信號產生器(信號源)
        • 波形與函數產生器
        • 任意波形產生器
        • 脈衝產生器
        • HEV/EV/Grid 模擬器和測試系統
        • 直流電源供應器
        • 電源量測設備
        • 直流電子負載
        • 交流電源
      • 軟體
        • Application Software Testing
        • PathWave 設計軟體
        • PathWave 測試軟體
        • Application Software
        • 生產力軟體
        • Software Enterprise Agreement
        • 所有設計與測試軟體  
      • 無線產品
        • 無線網路模擬器
        • 通道模擬器
        • Nemo 無線網路解決方案
        • 5G OTA 暗室
        • Wireless Analyzers
        • 物聯網法規相符性測試解決方案
      • 模組化儀器
        • PXI 產品
        • AXIe 產品
        • 資料擷取 - DAQ
        • USB 產品
        • VXI 產品
        • 參考解決方案
        • All Modular Instruments  
      • 網路測試
        • 協定與負載測試
        • 網路測試硬體
        • Cloud Test
        • 網路效能監測
        • 5G NR 基地台測試
        • 無線存取和核心網路測試
        • Network Modeling
        • All Network Test  
      • 網路安全性與可視度
        • 網路導流設備
        • Cloud Visibility
        • 網路分流器
        • 旁路交換器
        • 網路安全
        • Application and Threat Intelligence
      • 新增產品
        • 在線測試系統
        • 特定應用測試系統與元件
        • 參數測試解決方案
        • 光學量測產品
        • 雷射干涉儀與校驗系統
        • Monolithic Laser Combiners & Precision Optics
        • MMIC 毫米波與微波裝置
      • 服務
        • KeysightCare 服務和支援
        • KeysightAccess Service
        • 校驗服務
        • 維修服務
        • Technology Refresh Services
        • 測試即服務(TaaS)
        • Network/Security Services
        • Consulting Services
        • Financial Services
        • 訓練服務
        • Keysight Support Portal
        • Used Equipment
        • 所有服務  
      • 所有產品、軟體、服務  
    • 解決方案
      • 5G
      • 雲端
      • 車聯網
      • 資料中心基礎設施
      • 設計與自動化
      • 嶄新技術
      • 能源生態系統
      • 高速數位系統設計
      • 物聯網(IoT)
      • 製造測試
      • 量測基本原理
      • 網路安全
      • 網路測試
      • 網路可視化
      • SDN,NFV,虛擬化
      • 軟體測試自動化
      • 所有解决方案  
    • 產業
      • 航太與國防
      • 汽車與能源
      • 通訊
      • 教育
      • 企業
      • 政府
      • 半導體
      • 服務提供者
      • 所有產業 + 技術  
    • 洞見是德
      • 探索新知
      • 成功案例
      • 部落格
      • Keysight University
    • 資源
    • 支援
      • 是德科技產品支援
      • Ixia 產品支援
    No product matches found - System Exception
    Tips for Optimizing Power Meter / Sensor Measurement Speed
    Application Notes

    Tips for Optimizing Power Meter / Sensor Measurement Speed

    Show Description

    Abstract

    Optimizing RF/MW power measurement speed on a power meter and a power sensor is often a subject of concern, especially in a manufacturing environment. This article describes some useful tips on how to effectively minimize test times while obtaining power measurements.

    Having a detailed understanding of some of the SCPI commands and settings of the Keysight Technologies power meter/sensor is one means of improving measurement speed without compromising measurement accuracy. Selecting the measurement speed settings best-suited to the application's need is another method. For example, this application note explains how the Fast measurement setting and buffer size can be best leveraged based on the power level of interest. To increase speed even further, it is important to choose the right format and units in which the results are to be returned. To eliminate as much wasted test time as possible, such as waiting for processes like sensor zeroing and calibration, a basic understanding of the complete operation is required.

    Table of Contents

    • Introduction
    • Practice 1: Measurement Query Method
    • Practice 2: Measurement Averaging
    • Practice 3: Trigger Mode
    • Practice 4: Power Sensor Measurement Speed
    • Practice 5: Buffer Mode Measurement
    • Practice 6: Watt Beats dBm in Speed
    • Practice 7: Real Beats ASCII in Speed
    • Practice 8: Operation Complete (*OPC) Query
    • Practice 9: External Triggering Measurement
    • Conclusion
    • Related Keysight Literature
    • Contact Keysight

    Introduction

    Power specifications are often the critical factor in the design, and ultimately the performance, of almost all RF and microwave equipment. Power meters and power sensors are commonly used to capture these power measurements. Understanding the capabilities of the power meter/sensor helps ensure the best power meter/sensor test methodology for capturing power measurement is correctly applied.

    That knowledge can prevent implementing choices that may cause inaccurate power measurement or needlessly lengthen test time in manufacturing. The following practices explain how to leverage some of the commands, settings, and output selections in order to obtain accurate power measurement and shorten test times.

    Practice 1: Measurement Query Method

    There are three different methods to query a measurement from the power meter. It is beneficial to understand the basic differences between these three query commands in order to fully optimize measurement speed.

    MEASure?

    This command is a compound command, consisting of ABORt, CONFigure, and READ?. It is the simplest of the query commands because it relies on the power meter to select the best settings for the requested configuration and immediately perform the measurement. One drawback to this command is that its use results in a longer test time and overrides some of the power meter’s settings, such as switching the meter from Free Run to Single Shot mode or changing the average count set to the ON state.

    READ?

    This command is another compound command that is equivalent to an ABORt followed by an INITiate and FETCH?. The READ? query is similar to MEAS? in that it causes the meter to perform initializations and auto-configuration. However, READ? gives users the flexibility to change certain settings such as the average count. The READ? The command allows users to manipulate the settings in order to optimize the measurement speed, resulting in a shorter test time than that realized using the MEAS? command.

    FETCH?

    FETCH? retrieves a reading upon measurement completion and puts it in the output buffer. The FETCH? command allows users to manipulate settings such as the average count. However, this command requires additional settling time to complete the average count process, or else FETCH? will return invalid data.

    Practice 2: Measurement Averaging

    Measurement average count is basically used to reduce signal noise in order to obtain better measurement accuracy, especially for a lower power signal. The power meter uses a digital filter to average the power readings. The number of readings averaged can range from 1 to 1,024. While increasing the number of measurements averaged reduces the measurement noise, the measurement time is increased. Users can manually configure the measurement average or keep the measurement average in auto mode (by default). When the auto measurement average mode is enabled, the power meter automatically sets the number of readings averaged based on the power level currently being measured as defined by the power meter.

    For example, a high power signal of +10 dBm requires a smaller average count for accurate measurement. The average count might be set to “1” by default from the power meter. Using the FETCH? command to query +10 dBm power gives an accurate measurement upon completion of the average count process. The FETCH? command produces results faster than READ? and MEAS?.

    Conversely, at low power, a noisy signal of –40 dBm requires a higher average count to reduce the noise. In this case, the power meter could, for example, select 128 for the average count. Using the FETCH? Command, if insufficient WAIT time is specified for the meter, all 128 readings may not be obtained before the results are averaged and the final value returned. The FETCH? query is faster because it returns measurements with or without completion of the average count process.

    變更email?
    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    必填欄位

    按下此鍵,代表您同意提供您的個人資料給是德科技。如需關於我們如何使用這些資料的資訊, 請查閱是德科技隱私權聲明。.

    感謝您!
    Download

    探索

    • 產品與服務
    • 解決方案
    • 產業
    • 活動
    • Keysight University

    Insights

    • Discover Insights
    • 成功案例
    • 資源
    • 部落格
    • 社群

    夥伴

    支援

    • 是德科技產品支援
    • Ixia 產品支援
    • 管理軟體授權
    • 產品訂單狀態
    • 零件

    關於是德科技

    • 新聞中心
    • 投資者關係
    • 企業社會責任
    • 多樣性、公平性和包容性
    • 供應鏈透明度
    • 招賢納士

    • Facebook:與是德連線 LinkedIn:與是德連線 Twitter:與是德連線 YouTube:與是德連線 WeChat:與是德科技互聯
    • © Keysight Technologies 2000–2022
    • 隱私聲明
    • 使用條款
    • 網站意見