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Recent advancements in device and process technology present new parametric characterization challenges. This includes both more precise measurement requirements of static and dynamic device parameters and the ability to measure and analyze large volumes of parametric data more efficiently. For many years, the Keysight 4155C and 4156C Semiconductor Parameter Analyzers have been the de facto industry standard for semiconductor parameter analyzers. However, they are now obsolete. The Keysight B1500A Semiconductor Device Analyzer is the next generation of parameter analyzers. It is capable of meeting these new challenges instead of the 4155C/4156C. This application note details the top 3 reasons to migrate from the 4155C/4156C to the B1500A:
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