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As the electronic manufacturing industry embraces digital transformation towards being a Smart factory, the abundance of test and measurement data generated from the production floor is a valuable source for advanced analytics to provide actionable insights that improve productivity and Overall Equipment Efficiency (OEE). Being an engineer supporting manufacturing production myself, I fully understand the pressure and challenge one can face during New Product Introduction (NPI) stage and Mass Production Run (MR) stage. An engineer these days have limited time and resources (like allocation of equipment and number of boards) to complete the test debug to release to mass production. Thereafter, to support production mode and sustain the high level of First Pass Yield (FPY) and product quality.
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