詳細はこちら
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CMOSのバイアス温度不安定性の測定方法
高速ストレス・測定・ストレス試験を用いて、負のバイアス温度不安定性(NBTI)および正のバイアス温度不安定性(PBTI)による劣化を測定し、デバイスの回復を最小限に抑えつつ、しきい値電圧の変動を把握する。
詳細はこちら