Highlights

x1149 Boundary Scan Analyzer - Versatile yet Easy to use Board Test Tool

The x1149 is a tool for engineers to perform structural tests, such as open and short tests on their PCBAs. It also performs In-System Programming for devices such as FieldProgrammable Gate Arrays (FPGAs) and Complex Programmable Logic Devices (CPLDs).

Additionally, x1149 programs PROM (Programmable Read-Only Memory) devices and execute memory verification tests on devices such as DDR SDRAMs (Double Data Rate Synchronous Dynamic Random-Access Memory). This allows you to program and reprogram these devices in-system, providing greater flexibility and control during development. With its advanced testing capabilities and user-friendly software, the Keysight x1149 is the ideal solution for all your circuit board testing needs.

x1149 2.1 Features

  • IEEE Standards
    • 1149.1-2013 (New)
    • 1149.6-2015 (New)
    • 1149.1-2001
    • 1149.6-2003
    • 1687-2014
  • Custom test with Insert Source Language (ISL) 2.0
  • Support Autobank and Scan Path Linker
  • New BSDL extension for 1149.1 and 1149.6-2015 standard
  • Greater flexibility and support for IP packages and programmable features in both the 1149.1 and 1149.6 standard

Test Development

  • Maximize test coverage on connectors and non-boundary scan ICs
  • Excellent debug tools
  • Actionable pin-level failure reporting
  • In-system Programming

Applications

  • Excellent Test Coverage for Netcom, Server Products, and Automotive customers
  • IEEE 1687 Solution for Board Test and Embedded Instrumentation testing
  • Automated Configuration of Scan Path Linkers

Principais especificações

CET Ports
1
Form Factor
N/A
Remote Test Configurability
Sim
System Width
120 mm
TAP IO Ports
4
Type
Benchtop
CET Ports
Form Factor
Remote Test Configurability
System Width
TAP IO Ports
Type
1
N/A
Sim
120 mm
4
Benchtop
Visualizar mais
CET Ports:
1
Form Factor:
N/A
Remote Test Configurability:
Sim
System Width:
120 mm
TAP IO Ports:
4
Type:
Benchtop

Find the x1149 Software Subscriptions That's Right for You

Já possui um desses produtos? Visite o Suporte Técnico

What's New in Keysight x1149 2.1

IEEE 1149.1-2013 Standard

With the new standard of IEEE 1149.1-2013, you can expect around a 75% increase in test coverage with the following test capabilities:

  • Register mnemonic
  • IC reset control
  • Component initialization mechanism
  • Segmented boundary scan register
  • Power domain support
  • Test mode persistence
  • Electronic Chip Identification (ECID)
  • Procedural Description Language (PDL)

IEEE 1149.6-2015 Standard

IEEE 1149.6-2015 represents the most up-to-date version of the 1149.6 standard. This version of 1149.6 focuses on enhanced AC-coupled capacitor detection and differential interconnections on very high-speed (1+Gb/s) digital data paths. The test types included in this standard are the interconnect dot 6, bus wire dot 6, and shorted cap dot 6.

The value of having IEEE 1149.1-2013 and 1149.6-2015 is to enable:

  • Cost-saving in testing for boards and systems.
  • Preparation, execution, and interpretation of tests in a highly automated fashion and with high diagnostic resolution.
  • Facilitation of the operation of multiple vendors' devices together during testing, despite variations in characteristics and parameters used by the devices.
Keysight x1149 2.0

News & Events

Vision Award 2022

SbS Excellence Gold Award

We are thrilled to announce that Keysight's x1149 2.0 Boundary Scan Analyzer has received the prestigious SbS Excellence Gold Award (formerly Vision Award) in the 'Testing System-ATE' category at Nepcon Asia 2023 in Shenzhen as part of the 17th Step-by-Step Excellence Awards (formerly known as SMT China) for Innovative Products & Services in Electronics Manufacturing.

Featured Resources for x1149 Boundary Scan Analyzer

Flyers 2024.02.22

Get up to 69 Percent Off the x1149 Boundary Scan Runtime License Bundle

Get up to 69 Percent Off the x1149 Boundary Scan Runtime License Bundle

Maximize Savings: Dive into the x1149 Boundary Scan Runtime License Bundle with Up to 69% Off! Discover the perfect solution for efficient testing and unlock unparalleled discounts with this limited-time offer.

2024.02.22

Application Notes 2023.11.01

Enhancing Test Coverage Analysis with Keysight x1149

Enhancing Test Coverage Analysis with Keysight x1149

This application note explores the significance of the Keysight x1149 Boundary Scan Analyzer 2.0 in optimizing the analysis of test coverage for complex board designs. The report discusses the challenges faced by OEMs in modern electronic design and testing, emphasizing the importance of Design for Testability (DFT) analysis. It introduces the Keysight BSCAN DFT report as a valuable tool for evaluating BSCAN design correctness and generating comprehensive DFT reports. The application note further delves into the Test Coverage Report, highlighting its key features, test coverage categories, and the effectiveness of the reporting scheme in visualizing circuit configurations. By leveraging this advanced reporting scheme, OEMs can enhance testing processes, mitigate errors, and ensure product robustness in the face of modern design complexities.

2023.11.01

Application Notes 2023.10.31

Maximizing Testing Efficiency with keysight's x1149 Boundary Scan Analyzer 2.0

Maximizing Testing Efficiency with keysight's x1149 Boundary Scan Analyzer 2.0

Keysight's x1149 Boundary Scan Analyzer 2.0 is a robust tool that empowers users to test IC interconnects without physical probes, greatly enhancing test coverage. This paper delves into the performance improvements offered by the x1149 Boundary Scan Analyzer 2.0. By upgrading to this version, users can overcome challenges related to BSDL parsing time, memory usage, and test node support limitations. The enhancements encompass faster BSDL parsing, reduced memory consumption, and increased test node support, providing an uninterrupted and stable testing experience. This upgrade optimizes system resources, streamlines testing processes, and ensures accurate and reliable results, making it an invaluable asset for testing complex electronic systems.

2023.10.31

Data Sheets 2023.08.14

x1149 Boundary Scan Analyzer

x1149 Boundary Scan Analyzer

The Keysight x1149 is a comprehensive and versatile board test solution that provides everything you need to efficiently test and analyze circuit boards during every stage of the development process. Whether you're in the research and development phase or preparing for production, the Keysight x1149 makes it easy to design, analyze, and test your circuit boards with its coherent software interface.

2023.08.14

Application Notes 2023.07.31

Enhancing Efficiency in Server Board Testing with x1149 Boundary Scan Analyzer 2.0

Enhancing Efficiency in Server Board Testing with x1149 Boundary Scan Analyzer 2.0

This application note will delve into the capabilities of x1149 Boundary Scan Analyzer 2.0 for server board chipset testing, which poses various challenges, such as complex interconnects, limited access points, and increasing component density. This paper also aims to showcase how x1149 effectively addresses these challenges and ensures accurate and reliable testing of chipsets.

2023.07.31

Case Studies 2022.07.21

X1149 Brings Faster Testing for Server Boards

X1149 Brings Faster Testing for Server Boards

ICT (In-Circuit Testing) is well-known for its ability to provide a quick and comprehensive analysis of the PCBA's components and interconnectivity. However, ICT alone may not be sufficient because high-speed PCBA testing may necessitate a different approach. In this case study, we demonstrate how we assisted one of the world's largest original design manufacturers (ODMs) in improving the test process for their high-speed PCBA products.

2022.07.21

Technical Overviews 2019.09.18

x1149 Boundary Scan Analyzer

x1149 Boundary Scan Analyzer

The x1149 boundary scan analyzer brings you better coverage, better diagnostics and best-in-class usability to your work bench to meet your boundary scan test needs.

2019.09.18

Application Notes 2018.10.23

IEEE 1687 – Silicon Test to Board Test

IEEE 1687 – Silicon Test to Board Test

This application note is to provide an overview to the audience on the use case of IEEE 1687 in their test environment and how it benefits their testing.

2018.10.23

Data Sheets 2018.10.05

Boundary Scan Test Modules for PCIE Loopback Test

Boundary Scan Test Modules for PCIE Loopback Test

Describes Boundary Scan Test Modules for PCIE Loopback Test.

2018.10.05

Data Sheets 2018.09.04

Boundary Scan Test Modules for DDR4 DIMM Connector

Boundary Scan Test Modules for DDR4 DIMM Connector

Keysight boundary scan DIMM connector test modules provide fast and easy debugging.

2018.09.04

Application Notes 2018.05.24

Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer

Developing IEEE 1687 Tests on N1125A x1149 Boundary Scan Analyzer

This application note provides an overview of the IEEE 1687 standard and its implementation in board test. It then describes the steps to develop tests on x1149.

2018.05.24

Application Notes 2018.03.06

Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage

Integrating Keysight x1149 and Mini ICT for Better ICT Test Coverage

Improve test coverage with the integration of the x1149 and Mini ICT into a single test station and extend the usage and flexibility of both platforms.

2018.03.06

Flyers 2018.01.31

[Mounting on ECU boards] Pinpointing Open Joints for Pads for BGAs and Connectors! Non-contact sensor technology VTEP

[Mounting on ECU boards] Pinpointing Open Joints for Pads for BGAs and Connectors! Non-contact sensor technology VTEP

Flyer

2018.01.31

Application Notes 2017.11.30

x1149 Boundary Scan Solution for Blade Server Board

x1149 Boundary Scan Solution for Blade Server Board

Keysight’s x1149 offers great flexibility for boundary scan. See how the multi-chain feature helps you achieve boundary scan interconnection easily.

2017.11.30

Application Notes 2017.11.30

Boundary Scan DFT Guidelines for Good Test Coverage

Boundary Scan DFT Guidelines for Good Test Coverage

This paper explains what boundary scan, and discusses DFT guidelines for enhancing PCB test coverage and ensure chain integrity.

2017.11.30

Application Notes 2017.10.09

Automated Configuration of Scan Path Linkers Using x1149

Automated Configuration of Scan Path Linkers Using x1149

See how the automated scan path linker in Keysight’s x1149 Boundary Scan Analyzer helps simplify boundary scan implementation and boundary scan chain management.

2017.10.09

Technical Overviews 2017.08.13

x1149 Pin Constraints Feature

x1149 Pin Constraints Feature

This overview describes how the pin constraints feature can improve boundary scan test coverage and perform debugging, eliminating manual BSDL file editing and test regeneration.

2017.08.13

Article Reprints 2017.03.31

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA

This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA).

2017.03.31

Article Reprints 2016.02.16

Testing a Network Communication PCBA from Prototype to Manufacturing

Testing a Network Communication PCBA from Prototype to Manufacturing

Early implementation of BST can cut test costs and time.

2016.02.16

Article Reprints 2016.02.15

The Boundary Scan Toolbox

The Boundary Scan Toolbox

Find out how boundary scan can enable embedded and other value-added test in your toolbox.

2016.02.15

Article Reprints 2016.02.15

New IEEE Standards for Board and System Tests

New IEEE Standards for Board and System Tests

This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

2016.02.15

Article Reprints 2016.02.11

I’m a Board Test Engineer and I’m Loving It!

I’m a Board Test Engineer and I’m Loving It!

Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

2016.02.11

Article Reprints 2016.02.11

ABCs of Writing a Custom Boundary Scan Test

ABCs of Writing a Custom Boundary Scan Test

This article provides sample vectors and code for expanding test coverage with boundary scan.

2016.02.11

Article Reprints 2016.02.08

Testing the Internet of Things

Testing the Internet of Things

Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

2016.02.08

Article Reprints 2016.02.08

Manufacturing Test Solutions for SSDS

Manufacturing Test Solutions for SSDS

A new system performs both ICT and boundary scan in high-volume settings.

2016.02.08

Article Reprints 2016.02.04

The Flash Programming Flow

The Flash Programming Flow

On-board flash memory device testing and programming.

2016.02.04

Article Reprints 2016.02.02

Testing of Small Form-Factor Products

Testing of Small Form-Factor Products

Boundary scan and embedded test will need to make up for ICT gaps.

2016.02.02

Article Reprints 2016.02.02

Making Boundary Scan Easy

Making Boundary Scan Easy

Testing boundary scan devices no longer need be a laborious task.

2016.02.02

Application Notes 2015.10.29

Configuring Lattice BSCAN2 Scan Path Linker

Configuring Lattice BSCAN2 Scan Path Linker

Learn how to configure lattice BSCAN2 scan path linkers with a boundary scan linker mux device from Keysight.

2015.10.29

Application Notes 2015.05.25

Implementing Cover-Extend Test on Boundary Scan Analyzers

Implementing Cover-Extend Test on Boundary Scan Analyzers

Understand the generation process of cover-extend testing, a fixturing design for CET implementation on x1149 boundary scan analyzers. Learn more!

2015.05.25

Technical Overviews 2015.04.27

Understanding the Operation and Usage of Manufacturing Execution Systems

Understanding the Operation and Usage of Manufacturing Execution Systems

This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications.

2015.04.27

Application Notes 2014.08.02

Releasing the "Test Sequence" and "Test" to Production on the Boundary Scan Analyzer

Releasing the "Test Sequence" and "Test" to Production on the Boundary Scan Analyzer

This paper describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer. Learn more.

2014.08.02

Application Notes 2014.08.02

Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer

Configuring Boundary Scan Chains on Keysight x1149 Boundary Scan Analyzer

This application note provides the procedure for configuring the boundary scan chain of a board using the Keysight x1149 boundary scan analyzer.

2014.08.02

Application Notes 2014.08.02

Merging Boards on Keysight x1149 Boundary Scan Analyzer

Merging Boards on Keysight x1149 Boundary Scan Analyzer

This application note shows how to connect two or more boards to form a single boundary scan chain using the Keysight x1149 boundary scan analyzer.

2014.08.02

Application Notes 2014.08.02

Modifying DDR Libraries for Silicon Nail Test Generation

Modifying DDR Libraries for Silicon Nail Test Generation

Find how to modify DDR libraries for silicon nail test generation on the Keysight x1149 boundary scan analyzer. Explore the nail test generation procedures!

2014.08.02

Veja todos os recursos

Veja todos os recursos

Want help or have questions?