V2920A RF Vector Signal Generator
- 10 MHz to 4 GHz or 6 GHz
- -130 dBm to +13 dBm output power at 1 GHz with option V2920A-LAR
- ±0.6 dB absolute amplitude accuracy at 1 GHz (typical)
- ≤300 µs frequency switching and ≤150 µs amplitude switching time (open loop)
Extensive Synchronization for Femtocell Testing
- Accurate characterization and testing with wide external frequency lock range of 1 MHz to 60 MHz
- Link directly to other instrumentation such as V2820A VSA with trigger input lines and synchronization output line
- Triggering and synchronization minimizes wait time latency
Applications and Operation Flexibility
- MIMO-ready capability for WLAN and WiMAX™
- 80 MHz bandwidth, 100 mega sample arbitrary waveform generator option
- Baseband I-Q output option for transmitter testing
- Extensive signal generation library and signal creation software: analog and digital modulation, cellular and wireless standards
The V2920A RF vector signal generator outputs both CW and modulated signals from 10 MHz to 4 GHz or 6 GHz for R&D and production test of wireless chipsets, wireless modules, and wireless devices. This no-compromise signal generator combines high-speed with outstanding phase noise performance. The V2920A can download waveform files at high speed and offers an arbitrary waveform generator capable of bandwidths as wide as 80 MHz, so it can download large, complex, wide-bandwidth signal files quickly. This helps researchers develop sophisticated new wireless transmission schemes and production test engineers develop test schemes that exercise their devices thoroughly.
Use the V2920A’s wide external reference frequency range of 1 MHz to 60 MHz and external trigger inputs to ensure accurate characterization and testing of a wide range of wireless devices, including femtocells. For production test, the V2920A can be linked directly to other instrumentation such as the V2820A RF vector signal analyzer with trigger input lines and synchronization output lines. The triggering and synchronization capability minimizes wait time latency in setting up instruments for new test conditions.