A dedicated user interface specifically designed for this application
Import of PCM data and related bias information form Excel spreadsheets
Import and display statistical information of PCM data (mean and spread values)
Direct support of BSIM3, BSIM4, PSP, HiSIM2 and BSIMSOI4 models
Direct links to simulators including ADS, Spectre and HSPICE.
Display, tune and optimize user defined scaling and I-V diagrams
Customizable automatic generation of HTML reports
Open architecture enables import and use of traditional I-V traces in conjunction with PCM data plots
Note: Model number 85199K has been discontinued; however, the feature/capability is now included in the W8550EP/ET.
The information below is provided for reference only.
The IC-CAP Target Modeling extraction package (85199KL) enables engineers to efficiently extract or re-center CMOS models based on process control monitor (PCM) target data.
Traditional CMOS modeling uses extensive I-V and C-V data for various device geometries. These are typically obtained from time consuming measurements when the process is stable and mature. To extract accurate CMOS models much earlier in the design cycle, Target Modeling uses process control monitor (PCM) data, typically fast single bias point measurements, which are commonly available in the early stages of process development.
The Extraction Package includes a dedicated UI main window that manages the PCM data import and the creation of scaling and I-V diagrams. Device information and PCM data are imported directly from excel spreadsheet. Convenient wizards enable you to define subsets of devices and derive PCM data scaling diagrams (e.g. Ion vs. L, Ioff vs. W, etc.).
A dedicated user interface enables you to combine diagrams into multiple plots. The powerful IC-CAP Plot Optimizer tool enables you to conveniently select model parameters and tune and optimize scaling and I-V plots.
Powerful simulator links to ADS enables real time tuning performance when simulating multiple devices.