詳細はこちら
segmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductorsegmentation:campaign/IC_Semi_Mfg,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Optical_Modulation_Analyzers,segmentation:business-unit/CSG,keysight:product-lines/3e,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/photonic-and-optical-test,keysight:dtx/solutions/facets/workflow-stage/qa,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor
シリコンフォトニクスにおけるウェハーレベル電力掃引の自動化方法
波長可変レーザーとプログラマブル減衰器を用いて、シリコンフォトニクスデバイスの特性評価のためのウェハーレベルでの光パワー掃引を自動化し、ウェハー全体にわたって損失、応答度、飽和度を高い再現性で測定します。
詳細はこちら