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segmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054gsegmentation:campaign/Digital_General_Purpose,segmentation:product-category/Oscilloscopes_BERTs_AWGs,segmentation:product-category/Oscilloscopes_BERTs_AWGs/Oscilloscopes_upto_2GHz,segmentation:business-unit/CSG,keysight:product-lines/1a,segmentation:funnel/bofu,keysight:dtx/solutions/facets/design-and-test-product/oscilloscope---logic-analyzer,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/development-area/high-speed-digital,keysight:dtx/solutions/facets/industry/semiconductor,keysight:models/ms/msox4054g
Comment mesurer les pertes de puissance et d'énergie d'un transistor de commutation
Pour mesurer les pertes de puissance et d'énergie des transistors de commutation, il est nécessaire de disposer d'un oscilloscope Advanced équipé d'un logiciel de mesure de puissance, de sondes différentielles haute tension, de sondes de courant et d'une fonction de correction de l'inclinaison des signaux, afin de garantir une analyse précise des pertes de commutation.
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