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keysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/facets/design-and-test-product/power-supply,keysight:models/pz/pz2100a,keysight:models/pw/pw9251akeysight:models/pz,keysight:product-lines/1h,segmentation:product-formfactor/Modular,segmentation:product-category/IC_Semi_Mfg/Semiconductor_Test,segmentation:funnel/tofu,segmentation:campaign/IC_Semi_Mfg,keysight:dtx/solutions/facets/development-area/power,keysight:dtx/solutions/facets/workflow-stage/functional-test,keysight:dtx/solutions/facets/industry/semiconductor,segmentation:product-category/IC_Semi_Mfg,segmentation:business-unit/EISG,keysight:dtx/solutions/fac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Como caracterizar circuitos integrados de baixo consumo de energia
A medição das características de corrente/tensão de um CI de baixa potência requer uma variedade de instrumentos básicos, incluindo várias fontes de alimentação, multímetros digitais (DMMs), geradores de pulso e digitalizadores. Saiba como caracterizar CIs de baixa potência com eficiência e rapidez usando uma única unidade de fonte/medição (SMU).
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