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Featured Resources for the Parametric Test Solutions

Technical Overviews 2019.11.30

Pulsed-IV Parametric Test Solutions

This Pulsed-IV selection guide provides an overview and side-by-side comparison of all of Keysight's to determine the best solution to meet your unique needs.

2019.11.30

User Manuals 2015.09.30

E5250A Switching Matrix User's Guide

Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

2015.09.30

Technical Overviews 2020.01.06

Parametric Instrument Accessories

This document describes accessories for Keysight parametric measurement instruments and explains how to connect parametric measurement instruments to a wafer prober using the accessories.

2020.01.06

Data Sheets 2022.06.29

E5250A Low Leakage Switch Mainframe

This data sheet includes a complete set of specifications and supplemental technical information.

2022.06.29

Application Notes 2022.12.29

Why Migrate from the 4155C and 4156C to the B1500A?

This application note shows you the advantages of migrating from 4155C/56C to B1500A.

2022.12.29

Application Notes 2017.12.02

Low and High Frequency C-V Measurement of Semiconductors

The E4980A and 4284A Precision LCR Meters with their DC bias capabilities and wide frequency range can make low and high frequency semiconductor C-V measurements.

2017.12.02

Application Notes 2020.07.11

Impedance Measurement Handbook

Learn the basics of impedance measurements using Keysight LCR meters, impedance analyzers, and network analyzers. Explore impedance measurement techniques and tools.

2020.07.11

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