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Time-to-Market and Lower Cost-of-Test

 

  • Reduce your cost-of-test by high throughput
  • Overcome your test challenges in R&D and production
  • Precise low-level measurement performance
  • Proven solution in many customers in the world
  • Global support formation with skillful engineers
  • Various solution line-up with low transition cost
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NX4881A
4881HV High Voltage Wafer Test System 
Starting from  
Maximum Number of Measurement Pins: 29
Minimum current measurement resolution: 10 fA
Minimum Voltage Measurement Resolution: 2 µV
Maximum Number of SPGU output channels: n/a
P9001A
P9001A Massively Parallel Parametric Test System 
Starting from  
Maximum Number of Measurement Pins: 100
Minimum current measurement resolution: 0.1 fA
Minimum Voltage Measurement Resolution: 2 µV
Maximum Number of SPGU output channels: n/a
P9002A
P9002A Parallel Parametric Test System 
Starting from  
Maximum Number of Measurement Pins: 100
Minimum current measurement resolution: 0.1 fA
Minimum Voltage Measurement Resolution: 2 µV
Maximum Number of SPGU output channels: 4 channels
N9100A
4080 Series Parametric Test Systems 
Starting from  
Maximum Number of Measurement Pins: 48
Minimum current measurement resolution: 1 fA
Minimum Voltage Measurement Resolution: 2 µV
Maximum Number of SPGU output channels: 10 channels
NX5402A
NX5402A Silicon Photonics Wafer Test System 
Starting from  
Maximum Number of Measurement Pins: 12 (optical in), 12 (optical out), 30 (electrical)
Minimum current measurement resolution: n/a
Minimum Voltage Measurement Resolution: n/a
Maximum Number of SPGU output channels: n/a
NX5730A
NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution 
Starting from  
Maximum Number of Measurement Pins: 2
Minimum current measurement resolution: 1 pA
Minimum Voltage Measurement Resolution: n/a
Maximum Number of SPGU output channels: n/a
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  • KeysightCare Support Plans

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  • Calibration Services

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  • Tech Refresh Services

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    • Featured Resources for the Parametric Test Solutions

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