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Time-to-Market and Lower Cost-of-Test

  • Reduce your cost-of-test by high throughput
  • Overcome your test challenges in R&D and production
  • Precise low-level measurement performance
  • Proven solution in many customers in the world
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  • Various solution line-up with low transition cost

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P9001A
P9001A Massively Parallel Parametric Test System
Maximum Number of SPGU output channels: n/a
Maximum Number of Measurement Pins: 100
Minimum Current Measurement Resolution: 1 fA
Minimum Voltage Measurement Resolution: 2 micro volt
Parallel Parametric Test Capability: n/a
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NX5730A
NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution
Maximum Number of SPGU output channels: n/a
Maximum Number of Measurement Pins: 2
Minimum Current Measurement Resolution: 1 pA
Minimum Voltage Measurement Resolution: n/a
Parallel Parametric Test Capability: n/a
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P9002A
P9002A Parallel Parametric Test System
Maximum Number of SPGU output channels: 4 channels
Maximum Number of Measurement Pins: 100
Minimum Current Measurement Resolution: 0.1 fA
Minimum Voltage Measurement Resolution: 2 micro volt
Parallel Parametric Test Capability: n/a
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Featured Resources for the Parametric Test Solutions

Technical Overviews 2019.11.29

Pulsed-IV Parametric Test Solutions

Pulsed-IV Parametric Test Solutions

This Pulsed-IV selection guide provides an overview and side-by-side comparison of all of Keysight's to determine the best solution to meet your unique needs.

2019.11.29

User Manuals 2015.09.29

E5250A Switching Matrix User's Guide

E5250A Switching Matrix User's Guide

Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

2015.09.29

Technical Overviews 2020.01.05

Parametric Instrument Accessories

Parametric Instrument Accessories

This document describes accessories for Keysight parametric measurement instruments and explains how to connect parametric measurement instruments to a wafer prober using the accessories.

2020.01.05

Data Sheets 2015.11.18

E5250A Low Leakage Switch Mainframe

E5250A Low Leakage Switch Mainframe

This data sheet includes a complete set of specifications and supplemental technical information.

2015.11.18

Application Notes 2017.11.30

Migrating from 4155C/4156C to B1500A Semiconductor Parameter Analyzers

Migrating from 4155C/4156C to B1500A Semiconductor Parameter Analyzers

The B1500A semiconductor parameter analyzer is designed to replace the 4155C and 4156C, which have been the de facto parametric characterization standard for years.

2017.11.30

Application Notes 2017.12.01

Low and High Frequency C-V Measurement of Semiconductors

Low and High Frequency C-V Measurement of Semiconductors

The E4980A and 4284A Precision LCR Meters with their DC bias capabilities and wide frequency range can make low and high frequency semiconductor C-V measurements.

2017.12.01

Application Notes 2020.07.10

Impedance Measurement Handbook

Impedance Measurement Handbook

This handbook introduces the basics of impedance measurements using Keysight's LCR meters and impedance analyzers. Learn some great impedance measurement techniques!

2020.07.10

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