HIGHLIGHTS

  • short-wire fixturing technology ensures transportability, repeatability, and stability
  • innovative design ensures easy maintenance and fixture change
  • compact chassis saves 33% of floor space over conventional 3070 systems
  • single point of contact for your automated ICT solution
  • comprehensive in-system suite of boundary scan tools

The i3070 Series 5i retains the popular and proprietary Keysight short-wire fixturing technology used in the Keysight 3070 and i3070 systems.

Short-wire fixturing eliminates problems commonly found with long-wire fixturing such as noise and deterioration of test stability. This translates into transportable, repeatable, and stable tests on your i3070 Series 5i even if you need to deploy tests halfway across the globe or on different manufacturing sites.

The i3070 Series 5i brings ease of use to the busy line operator and test engineer. The card cage is mounted on heavy-duty slides and can be easily pulled out to facilitate replacement of module cards.

An ergonomically-designed drawer unit enables fixtures to be easily loaded onto or unloaded from the test system. These features save both time and effort especially for lines running a higher mix of products.

An array of tools like intelligent fixture identification, board orientation detection, and test plan revision controls are available to help you develop best-in-class automation solutions.

The i3070 Series 5i is fully backward compatible with 3070 and i3070 test programs.

For more information about ict systems, please visit ICT System - i3070.

Principais especificações

Fixture Actuation
Press Down
Max Node Count
2592
Max Parallel Testing
2
System Type
Automated Handler
System Width
1206 mm
Fixture Actuation
Max Node Count
Max Parallel Testing
System Type
System Width
Press Down
2592
2
Automated Handler
1206 mm
Visualizar mais
Fixture Actuation:
Press Down
Max Node Count:
2592
Max Parallel Testing:
2
System Type:
Automated Handler
System Width:
1206 mm
E9988E In-Line 2-Module ICT System

Interested in a E9988E?

Featured Resources for E9988E 2-Module In-Circuit Test (ICT) System, i337x Series 5i

Application Notes 2024.05.15

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

Integrating Standalone x1149 Boundary Scan Analyzer into i3070 Series 7i

This application note presents an installation guide for integrating the x1149 boundary scan analyzer into the i3070 Series 7i In-Circuit Test (ICT) system, enabling efficient boundary scan testing alongside in-circuit testing.

2024.05.15

Application Notes 2024.05.07

Integrating LED Analyzer with Keysight's In-Circuit Tester

Integrating LED Analyzer with Keysight's In-Circuit Tester

This application note explores how to seamlessly integrate the FEASA F LED Analyzer with Keysight's i3070 Series 7i In-Circuit Test System to streamline LED testing processes.

2024.05.07

Application Notes 2024.01.30

Streamlining In-System Programming

Streamlining In-System Programming

This application note explores the challenges and solutions in implementing In-System Programming (ISP) on densely populated circuit boards. Focusing on Keysight's advanced ICT system, the document discusses upgraded hardware configurations and introduces the ISP OpenTAP plug-in for streamlined test sequence generation. With a simplified approach to test generation and execution, Keysight's solution offers an efficient pathway for ISP integration. This resource serves as a practical guide for test engineers seeking to optimize ISP processes, enhance efficiency, and reduce complexities in programming.

2024.01.30

Application Notes 2024.01.30

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

Integrating x1149 Boundary Scan Analyzer for Enhanced Modularity and Versatility

This application note explores the integration of Keysight's x1149 Boundary Scan Analyzer with the i3070 Series 7i In-Circuit Test System, introducing a flexible and efficient approach to boundary scan testing. The integration eliminates challenges associated with built-in boundary scan systems, offering enhanced security, modularity, and greater flexibility in adapting to evolving protocols and functionalities.

2024.01.30

Application Notes 2024.01.29

New i3070 Series 6 is 1.5x Faster than the Series 5

New i3070 Series 6 is 1.5x Faster than the Series 5

This application note summarizes some of the results of Vectorless Test Enhanced Probe (VTEP) early tests conducted at customer sites.

2024.01.29

Application Notes 2024.01.25

Quad Density Pin Card for Enhanced Throughput and Reliability

Quad Density Pin Card for Enhanced Throughput and Reliability

This application note addresses the evolving challenges in testing modern and densely packed Printed Circuit Board Assemblies (PCBAs) and introduces the Quad Density (QD) pin card as a groundbreaking solution. As electronic systems grow in complexity, the need for comprehensive testing becomes crucial. The current limitations of double-density pin cards prompt the development of the QD pin card, which offers 320 test pins on a single board, more than doubling its predecessor's capabilities. The QD pin card not only enhances test pin capacity but also introduces features like built-in discharge circuits and temperature sensors to optimize testing efficiency. Backward compatibility ensures seamless integration with older testing systems, and electronic serial number storage facilitates easy identification and troubleshooting.

2024.01.25

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Veja todos os recursos

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